Applications of SEM Automated Mineralogy
Applications of SEM Automated Mineralogy

Author: Bernhard Schulz

Publisher: MDPI

Published: 2021-04-09

Total Pages: 224

ISBN-13: 3036506225

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During the last decade, software developments in Scanning Electron Microscopy (SEM) provoked a notable increase of applications to the study of solid matter. The mineral liberation analysis (MLA) of processed metal ores was an important drive for innovations that led to QEMSCAN, MLA and other software platforms. These combine the assessment of the backscattered electron (BSE) image to the directed steering of the electron beam for energy dispersive spectroscopy (EDS) to automated mineralogy. However, despite a wide distribution of SEM instruments in material research and industry, the potential of SEM automated mineralogy is still under-utilised. The characterisation of primary ores, and the optimisation of comminution, flotation, mineral concentration and metallurgical processes in the mining industry by generating quantified data, is still the major application field of SEM automated mineralogy. However, there is interesting potential beyond these classical fields of geometallurgy and metal ore fingerprinting. Slags, pottery and artefacts can be studied in an archeological context for the recognition of provenance and trade pathways; soil, and solid particles of all kinds, are objects in forensic science. SEM automated mineralogy allows new insight in the fields of process chemistry and recycling technology.

Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics

Author: Zhiyong Ma

Publisher: CRC Press

Published: 2017-03-27

Total Pages: 889

ISBN-13: 135173394X

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Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Crystal Growth of Intermetallics
Crystal Growth of Intermetallics

Author: Peter Gille

Publisher: Walter de Gruyter GmbH & Co KG

Published: 2018-12-17

Total Pages: 292

ISBN-13: 311049678X

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Intermetallic compounds are in the focus of solid-state research for a wide range of future applications, e.g. in heterogeneous catalysis, for thermoelectric generators, and basic research of quantum critical effects. A comprehensive overview is given on various crystal growth techniques that are particularly adopted to intermetallic phases. Experienced authors from leading institutes give detailed descriptions of the specific problems in crystal growth of intermetallic compounds and approaches to solve them.

Organization Descriptions and Cross-references
Organization Descriptions and Cross-references

Author: Union of International Associations Staff

Publisher: De Gruyter Saur

Published: 2010-08-13

Total Pages: 1464

ISBN-13: 9783110230314

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Yearbook of International Organizations is the most comprehensive reference resource and provides current details of international non-governmental (NGO) and intergovernmental organizations (IGO). Collected and documented by the Union of International Associations (UIA), detailed information on international organizations worldwide can be found here. Besides historical and organizational information, details on activities, events or publications, contact details, biographies of the leading individuals as well as the presentation of networks of organizations are included.

Field Emission Scanning Electron Microscopy
Field Emission Scanning Electron Microscopy

Author: Nicolas Brodusch

Publisher: Springer

Published: 2017-09-25

Total Pages: 143

ISBN-13: 9811044333

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This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage