Spectroscopy for Materials Characterization
Spectroscopy for Materials Characterization

Author: Simonpietro Agnello

Publisher: John Wiley & Sons

Published: 2021-09-08

Total Pages: 500

ISBN-13: 1119697328

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SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.

Data-driven Guide to the Analysis of X-ray Photoelectron Spectra Using RxpsG
Data-driven Guide to the Analysis of X-ray Photoelectron Spectra Using RxpsG

Author: Giorgio Speranza

Publisher:

Published: 2023-11

Total Pages: 0

ISBN-13: 9781032284712

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"This book provides a theoretical background to X-ray Photoelectron Spectroscopy (XPS) and a practical guide to the analysis of the XPS spectra using the RxpsG software, a powerful tool for XPS analysis. Although there are several publications and books illustrating the theory behind X-ray Photoelectron Spectroscopy and the origin of the spectral feature, this book provides an additional practical introduction to the use of RxspG. It illustrates how to use the RxpsG software to perform specific key operations, with figures and examples which the reader can reproduce themselves. The book contains a list of theoretical sections explaining the appearance of the various spectral features (core-lines, Auger components, valence bands, loss features etc). They are accompanied by practical steps so readers can learn how to analyze specific spectral features using the various functions of the RxpsG software. This book is useful guide for researchers in physics, chemistry, and materials science who are looking to begin using X-ray Photoelectron Spectroscopy, in addition to experienced researchers who want to learn how to use RxpsG"--

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Author: Siegfried Hofmann

Publisher: Springer Science & Business Media

Published: 2012-10-25

Total Pages: 544

ISBN-13: 3642273807

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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

X-ray Photoelectron Spectroscopy
X-ray Photoelectron Spectroscopy

Author: Paul van der Heide

Publisher: John Wiley & Sons

Published: 2011-11-01

Total Pages: 275

ISBN-13: 1118162900

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This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections.