Secondary Ion Mass Spectrometry SIMS V
Secondary Ion Mass Spectrometry SIMS V

Author: Alfred Benninghoven

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 578

ISBN-13: 3642827241

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This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.

Introduction to Focused Ion Beams
Introduction to Focused Ion Beams

Author: Lucille A. Giannuzzi

Publisher: Springer Science & Business Media

Published: 2006-05-18

Total Pages: 362

ISBN-13: 038723313X

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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectrometry

Author: J. C. Vickerman

Publisher: Oxford University Press, USA

Published: 1989

Total Pages: 368

ISBN-13:

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This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.

ToF-SIMS
ToF-SIMS

Author: J. C. Vickerman

Publisher: IM Publications

Published: 2013

Total Pages: 742

ISBN-13: 1906715173

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive

Chemical Imaging Analysis
Chemical Imaging Analysis

Author: Freddy Adams

Publisher: Elsevier

Published: 2015-06-06

Total Pages: 493

ISBN-13: 0444634509

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Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the functional behavior at the macroscopic scale. In a development process that started in the early 1960s, a variety of specialized analytical techniques was developed – or adapted from existing techniques – and these techniques have matured into versatile and powerful tools for visualizing structural and compositional heterogeneity. This text explores that journey, providing a general overview of imaging techniques in diverse fields, including mass spectrometry, optical spectrometry including X-rays, electron microscopy, and beam techniques. - Provides comprehensive coverage of analytical techniques used in chemical imaging analysis - Explores a variety of specialized techniques - Provides a general overview of imaging techniques in diverse fields

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Author: Sarah Fearn

Publisher: Morgan & Claypool Publishers

Published: 2015-10-16

Total Pages: 67

ISBN-13: 1681740885

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This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Tissue Engineering Using Ceramics and Polymers
Tissue Engineering Using Ceramics and Polymers

Author: Aldo R. Boccaccini

Publisher: Elsevier

Published: 2007-10-31

Total Pages: 625

ISBN-13: 1845693817

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Technology and research in the field of tissue engineering has drastically increased within the last few years to the extent that almost every tissue and organ of the human body could potentially be regenerated. With its distinguished editors and international team of contributors, Tissue Engineering using Ceramics and Polymers reviews the latest research and advances in this thriving area and how they can be used to develop treatments for disease states. Part one discusses general issues such as ceramic and polymeric biomaterials, scaffolds, transplantation of engineered cells, surface modification and drug delivery. Later chapters review characterisation using x-ray photoelectron spectroscopy and secondary ion mass spectrometry as well as environmental scanning electron microscopy and Raman micro-spectroscopy. Chapters in part two analyse bone regeneration and specific types of tissue engineering and repair such as cardiac, intervertebral disc, skin, kidney and bladder tissue. The book concludes with the coverage of themes such as nerve bioengineering and the micromechanics of hydroxyapatite-based biomaterials and tissue scaffolds. Tissue Engineering using Ceramics and Polymers is an innovative reference for professionals and academics involved in the field of tissue engineering. - An innovative and up-to-date reference for professionals and academics - Environmental scanning electron microscopy is discussed - Analyses bone regeneration and specific types of tisue engineering

Surface Science and Adhesion in Cosmetics
Surface Science and Adhesion in Cosmetics

Author: K. L. Mittal

Publisher: John Wiley & Sons

Published: 2021-04-06

Total Pages: 720

ISBN-13: 1119654823

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Activity in the arena of surface chemistry and adhesion aspects in cosmetics is substantial, but the information is scattered in many diverse publications media and no book exists which discusses surface chemistry and adhesion in cosmetics in unified manner. This book containing 15 chapters written by eminent researchers from academia and industry is divided into three parts: Part 1: General Topics; Part 2: Surface Chemistry Aspects; and Part 3: Wetting and Adhesion Aspects. The topics covered include: Lip biophysical properties and characterization; use of advanced silicone materials in long-lasting cosmetics; non-aqueous dispersions of acrylate copolymers in lipsticks; cosmetic oils in Lipstick structure; chemical structure of the hair surface, surface forces and interactions; AFM for hair surface characterization; application of AFM in characterizing hair, skin and cosmetic deposition; SIMS as a surface analysis method for hair, skin and cosmetics; surface tensiometry approach to characterize cosmetic products; spreading of hairsprays on hair; color transfer from long-wear face foundation products; interaction of polyelectrolytes and surfactants on hair surfaces; cosmetic adhesion to facial skin; and adhesion aspects in semi-permanent mascara; lipstick adhesion measurement.

Atom Probe Tomography
Atom Probe Tomography

Author: Williams Lefebvre

Publisher: Academic Press

Published: 2016-05-30

Total Pages: 418

ISBN-13: 0128047453

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Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. - Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials - Written for both experienced researchers and new users - Includes exercises, along with corrections, for users to practice the techniques discussed - Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Surface Treatment of Materials for Adhesion Bonding
Surface Treatment of Materials for Adhesion Bonding

Author: Sina Ebnesajjad

Publisher: William Andrew

Published: 2006-06-12

Total Pages: 277

ISBN-13: 0815519192

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This is a unique compilation of surface preparation principles and techniques for plastics, thermosets, elastomers, and metals bonding. With emphasis on the practical, it draws together in a single source technical principles of surface science and surface treatments technologies of plastics, elastomers, and metals. It is both a reference and a guide for engineers, scientists, practitioners of surface treatment, researchers, students, and others involved in materials adhesion and processing.This book describes and illustrates the surface preparations and operations that must be applied to a surface before acceptable adhesive bonding is achieved. It is meant to be a comprehensive overview, including more detailed explanation where necessary, in a continuous and logical progression. This book is intended to be a handbook for reference of surface treating processes. The more technical chapters can be bypassed to study the applied chapters. The text is accessible to readers with a college-level background in mathematics and chemistry, but an in-depth knowledge of adhesion technology is not required.