Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

Author: Nobuo Tanaka

Publisher: World Scientific

Published: 2014-08-21

Total Pages: 616

ISBN-13: 1783264713

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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Scanning Transmission Electron Microscopy of Nanomaterials
Scanning Transmission Electron Microscopy of Nanomaterials

Author: Nobuo Tanaka

Publisher:

Published: 2014-09-06

Total Pages: 616

ISBN-13: 9781848167902

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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents: Introduction (N Tanaka); Historical Survey of the Development of STEM Instruments (N Tanaka); Basic Knowledge of STEM: Basics of STEM (N Tanaka and K Saitoh); Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka); Theories of STEM Imaging: Theory for HAADF-STEM and Its Image Simulation (K Watanabe); Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara); Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto); Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi); Advanced Methods in STEM: Aberration Correction in STEM (H Sawada); Secondary Electron Microscopy in STEM (H Inada and Y Zhu); Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi); Electron Tomography in STEM (N Tanaka); Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka); Recent Topics and Future Prospects in STEM (N Tanaka). Readership: Graduate students and researchers in the field of nanomaterials and nanostructures. Key Features: Most advanced; befitting beginning graduate students; Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details; Spans from the basic theory to the applications of STEM

Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy

Author: Stephen J. Pennycook

Publisher: Springer Science & Business Media

Published: 2011-03-24

Total Pages: 764

ISBN-13: 1441972005

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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Electron Nano-Imaging
Electron Nano-Imaging

Author: Nobuo Tanaka

Publisher: Springer

Published: 2017-04-04

Total Pages: 340

ISBN-13: 4431565027

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In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

Field Emission Scanning Electron Microscopy
Field Emission Scanning Electron Microscopy

Author: Nicolas Brodusch

Publisher: Springer

Published: 2017-09-25

Total Pages: 143

ISBN-13: 9811044333

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This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Scanning Microscopy for Nanotechnology
Scanning Microscopy for Nanotechnology

Author: Weilie Zhou

Publisher: Springer Science & Business Media

Published: 2007-03-09

Total Pages: 533

ISBN-13: 0387396209

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy

Author: Alina Bruma

Publisher: CRC Press

Published: 2020-12-22

Total Pages: 162

ISBN-13: 0429516169

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Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.

Modeling Nanoscale Imaging in Electron Microscopy
Modeling Nanoscale Imaging in Electron Microscopy

Author: Thomas Vogt

Publisher: Springer Science & Business Media

Published: 2012-03-02

Total Pages: 190

ISBN-13: 1461421918

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Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Advanced Transmission Electron Microscopy
Advanced Transmission Electron Microscopy

Author: Jian Min Zuo

Publisher: Springer

Published: 2016-10-26

Total Pages: 741

ISBN-13: 1493966073

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This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Transmission Electron Microscopy
Transmission Electron Microscopy

Author: C. Barry Carter

Publisher: Springer

Published: 2016-08-24

Total Pages: 543

ISBN-13: 3319266519

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This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.