Practical Guide to Materials Characterization

Practical Guide to Materials Characterization

Author: Khalid Sultan

Publisher: John Wiley & Sons

Published: 2022-09-13

Total Pages: 228

ISBN-13: 3527350713

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Practical Guide to Materials Characterization Practice-oriented resource providing a hands-on overview of the most relevant materials characterization techniques in chemistry, physics, engineering, and more Practical Guide to Materials Characterization focuses on the most widely used experimental approaches for structural, morphological, and spectroscopic characterization of materials, providing background, insights on the correct usage of the respective techniques, and the interpretation of the results. With a focus on practical applications, the work illustrates what to use and when, including real-life examples showing which characterization techniques are best suited for particular purposes. Furthermore, the work covers the practical elements of the analytical techniques used to characterize a wide range of functional materials (both in bulk as well as thin film form) in a simple but thorough manner. To aid in reader comprehension, Practical Guide to Materials Characterization is divided into eight distinct chapters. To set the stage, the first chapter of the book reviews the fundamentals of materials characterization that are necessary to understand and use the methods presented in the ensuing chapters. Among the techniques covered are X-ray diffraction, Raman spectroscopy, X-ray spectroscopy, electron microscopies, magnetic measurement techniques, infrared spectroscopy, and dielectric measurements. Specific sample topics covered in the remaining seven chapters include: Bragg’s Law, the Von Laue Treatment, Laue’s Equation, the Rotating Crystal Method, the Powder Method, orientation of single crystals, and structure of polycrystalline aggregates Classical theory of Raman scattering, quantum theory of Raman spectroscopy, high-pressure Raman spectroscopy, and surface enhanced Raman spectroscopy Basic principles of XAS, energy referencing, XPS spectra and its features, Auger Electron Spectroscopy (AES), and interaction of electrons with matter Magnetization measuring instruments, the SQUID magnetometer, and the advantages and disadvantages of vibrating sample magnetometer (VSM) With comprehensive and in-depth coverage of the subject, Practical Guide to Materials Characterization is a key resource for practicing professionals who wish to better understand key concepts in the field and seamlessly harness them in a myriad of applications across many different industries.


Practical Materials Characterization

Practical Materials Characterization

Author: Mauro Sardela

Publisher: Springer

Published: 2014-07-10

Total Pages: 242

ISBN-13: 1461492815

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Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.


A Practical Guide to Microstructural Analysis of Cementitious Materials

A Practical Guide to Microstructural Analysis of Cementitious Materials

Author: Karen Scrivener

Publisher: CRC Press

Published: 2018-10-09

Total Pages: 540

ISBN-13: 1498738672

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A Practical Guide from Top-Level Industry Scientists As advanced teaching and training in the development of cementitious materials increase, the need has emerged for an up-to-date practical guide to the field suitable for graduate students and junior and general practitioners. Get the Best Use of Different Techniques and Interpretations of the Results This edited volume provides the cement science community with a state-of-the-art overview of analytical techniques used in cement chemistry to study the hydration and microstructure of cements. Each chapter focuses on a specific technique, not only describing the basic principles behind the technique, but also providing essential, practical details on its application to the study of cement hydration. Each chapter sets out present best practice, and draws attention to the limitations and potential experimental pitfalls of the technique. Databases that supply examples and that support the analysis and interpretation of the experimental results strengthen a very valuable ready reference. Utilizing the day-to-day experience of practical experts in the field, this book: Covers sample preparation issues Discusses commonly used techniques for identifying and quantifying the phases making up cementitious materials (X-ray diffraction and thermogravimetric analysis) Presents good practice oncalorimetry and chemical shrinkage methods for studying cement hydration kinetics Examines two different applications of nuclear magnetic resonance (solid state NMR and proton relaxometry) Takes a look at electron microscopy, the preeminent microstructural characterization technique for cementitious materials Explains how to use and interpret mercury intrusion porosimetry Details techniques for powder characterization of cementitious materials Outlines the practical application of phase diagrams for hydrated cements Avoid common pitfalls by using A Practical Guide to Microstructural Analysis of Cementitious Materials. A one-of-a-kind reference providing the do’s and don’ts of cement chemistry, the book presents the latest research and development of characterisation techniques for cementitious materials, and serves as an invaluable resource for practicing professionals specializing in cement and concrete materials and other areas of cement and concrete technology.


Materials Characterization

Materials Characterization

Author: Yang Leng

Publisher: John Wiley & Sons

Published: 2009-03-04

Total Pages: 384

ISBN-13: 0470822996

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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.


A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis

A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis

Author: Victor E. Buhrke

Publisher: Wiley-VCH

Published: 1997-11-19

Total Pages: 0

ISBN-13: 9780471194583

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The first hands-on guide to XRD and XRF sampling and specimen preparation Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume. This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips. With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort. Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials * Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more * Features special chapters on specimen preparation equipment and XRF standards * Contains useful bibliography and helpful references.


Handbook of Materials Characterization

Handbook of Materials Characterization

Author: Surender Kumar Sharma

Publisher: Springer

Published: 2018-09-18

Total Pages: 612

ISBN-13: 3319929550

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This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.


Practical Guide To Chemometrics

Practical Guide To Chemometrics

Author: Paul Gemperline

Publisher: CRC Press

Published: 2006-04-16

Total Pages: 552

ISBN-13: 1420018302

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The limited coverage of data analysis and statistics offered in most undergraduate and graduate analytical chemistry courses is usually focused on practical aspects of univariate methods. Drawing in real-world examples, Practical Guide to Chemometrics, Second Edition offers an accessible introduction to application-oriented multivariate meth


A Practical Guide to Transmission Electron Microscopy

A Practical Guide to Transmission Electron Microscopy

Author: Zhiping Luo

Publisher: Momentum Press

Published: 2015-12-04

Total Pages: 140

ISBN-13: 1606507044

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Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.


A Practical Guide to Scientific Data Analysis

A Practical Guide to Scientific Data Analysis

Author: David J. Livingstone

Publisher: John Wiley & Sons

Published: 2009-12-10

Total Pages: 358

ISBN-13: 047068481X

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Inspired by the author's need for practical guidance in the processes of data analysis, A Practical Guide to Scientific Data Analysis has been written as a statistical companion for the working scientist. This handbook of data analysis with worked examples focuses on the application of mathematical and statistical techniques and the interpretation of their results. Covering the most common statistical methods for examining and exploring relationships in data, the text includes extensive examples from a variety of scientific disciplines. The chapters are organised logically, from planning an experiment, through examining and displaying the data, to constructing quantitative models. Each chapter is intended to stand alone so that casual users can refer to the section that is most appropriate to their problem. Written by a highly qualified and internationally respected author this text: Presents statistics for the non-statistician Explains a variety of methods to extract information from data Describes the application of statistical methods to the design of “performance chemicals” Emphasises the application of statistical techniques and the interpretation of their results Of practical use to chemists, biochemists, pharmacists, biologists and researchers from many other scientific disciplines in both industry and academia.


A Practical Guide to Transmission Electron Microscopy, Volume II

A Practical Guide to Transmission Electron Microscopy, Volume II

Author: Zhiping Luo

Publisher: Momentum Press

Published: 2015-12-23

Total Pages: 223

ISBN-13: 1606509187

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Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.