CRC Handbook of Metal Etchants

CRC Handbook of Metal Etchants

Author: Perrin Walker

Publisher: CRC Press

Published: 1990-12-11

Total Pages: 1434

ISBN-13: 9781439822531

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This publication presents cleaning and etching solutions, their applications, and results on inorganic materials. It is a comprehensive collection of etching and cleaning solutions in a single source. Chemical formulas are presented in one of three standard formats - general, electrolytic or ionized gas formats - to insure inclusion of all necessary operational data as shown in references that accompany each numbered formula. The book describes other applications of specific solutions, including their use on other metals or metallic compounds. Physical properties, association of natural and man-made minerals, and materials are shown in relationship to crystal structure, special processing techniques and solid state devices and assemblies fabricated. This publication also presents a number of organic materials which are widely used in handling and general processing...waxes, plastics, and lacquers for example. It is useful to individuals involved in study, development, and processing of metals and metallic compounds. It is invaluable for readers from the college level to industrial R & D and full-scale device fabrication, testing and sales. Scientific disciplines, work areas and individuals with great interest include: chemistry, physics, metallurgy, geology, solid state, ceramic and glass, research libraries, individuals dealing with chemical processing of inorganic materials, societies and schools.


Fibre Optic Communication Devices

Fibre Optic Communication Devices

Author: Norbert Grote

Publisher: Springer Science & Business Media

Published: 2001-01-26

Total Pages: 496

ISBN-13: 9783540669777

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Optoelectronic devices and fibre optics are the basis of cutting-edge communication systems. This monograph deals with the various components of these systems, including lasers, amplifiers, modulators, converters, filters, sensors, and more.


Semiconductor Material and Device Characterization

Semiconductor Material and Device Characterization

Author: Dieter K. Schroder

Publisher: John Wiley & Sons

Published: 2015-06-29

Total Pages: 800

ISBN-13: 0471739065

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This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.


Silicon Epitaxy

Silicon Epitaxy

Author:

Publisher: Elsevier

Published: 2001-09-26

Total Pages: 514

ISBN-13: 0080541003

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Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The Willardson and Beer series, as it is widely known, has succeeded in producing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise that this tradition will be maintained and even expanded.


WDM Technologies: Passive Optical Components

WDM Technologies: Passive Optical Components

Author: Achyut K. Dutta

Publisher: Academic Press

Published: 2003-06-04

Total Pages: 551

ISBN-13: 0080543766

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The communications industry is at the onset of new expansion of WDM technology necessary to meet the new demand for bandwidth. This is the second of a four reference books that will cover this technology comprehensively with all of the major topics covered by a separate volumes - i.e. active components, passive components, systems and networks. This book is the first which covers all key passive optical components required for current and next generation optical communication systems. World-renowned authors, who are pioneers in their research area, have written the chapters in their area of expertise. The book highlights not only the principle of operation and characteristics of the passive optical components, but also provides an in-depth account of the state-of-the-art system applications.- Helps the reader to choose the right device for a given system application.- Provides the reader with insight and understanding for key passive optical components frequently being / to be used in the optical communication systems, essential building blocks of today's/next generation fiber optic networks.- Allows engineers working in different optical communication areas(i.e. from system to component), to understand the principle and mechanics of each key component they deal with for optical system design.- Covers Planar lightwave circuit (PLC) based router, different optical switches technologies (based on MEMS, thermo-optic, and electro-optic) and different optical amplifier technologies (based on semiconductor optical amplifier, EDFA ,and raman amplifier). - Highlights the operating principle of each component, system applications, and also future opportunities.


Sensing and Monitoring Technologies for Mines and Hazardous Areas

Sensing and Monitoring Technologies for Mines and Hazardous Areas

Author: Swadesh Chaulya

Publisher: Elsevier

Published: 2016-06-10

Total Pages: 434

ISBN-13: 0128031956

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Sensing and Monitoring Technologies for Mines and Hazardous Areas: Monitoring and Prediction Technologies presents the fundamentals of mining related geotechnical risk and how the latest advances in sensing and data communication can be used both to prevent accidents and provide early warnings. Opencast mining operations involve huge quantities of overburden removal, dumping, and backfilling in excavated areas. Substantial increases in the rate of accumulation of waste dumps in recent years has resulted in greater height of dumps and also has given rise to the danger of dump failures as steeper open pit slopes are prone to failure. These failures lead to loss of valuable human lives and damage to mining machinery. This book presents the most recent advances in gas sensors, methane detectors, and power cut-off systems. It also introduces monitoring of the gas strata and environment, and an overview of the use of Internet of Things and cloud computing for mining sensing and surveillance purposes. Targeted at geotechnical and mining engineers, this volume covers the latest findings and technology to prevent mining accidents and mitigate the inherent risk of the activity. - Presents complete details of a real-time slope stability monitoring system using wireless sensor networking and prediction technique based on multivariate statistical analysis of various parameters and analytical hierarchy process methods - Discusses innovative ideas and new concepts of sensing technologies, mine transport surveillance, digital mining, and cloud computing to improve safety and productivity in mining industry - Includes slope stability prediction software, downloadable through a companion website, which can be used for monitoring, analyzing, and storing different sensors and providing audio-visual, SMS, and email alerts - Covers the latest findings and technology to prevent mining accidents and mitigate the inherent risk


Fundamentals of Silicon Carbide Technology

Fundamentals of Silicon Carbide Technology

Author: Tsunenobu Kimoto

Publisher: John Wiley & Sons

Published: 2014-11-24

Total Pages: 565

ISBN-13: 1118313526

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A comprehensive introduction and up-to-date reference to SiC power semiconductor devices covering topics from material properties to applications Based on a number of breakthroughs in SiC material science and fabrication technology in the 1980s and 1990s, the first SiC Schottky barrier diodes (SBDs) were released as commercial products in 2001. The SiC SBD market has grown significantly since that time, and SBDs are now used in a variety of power systems, particularly switch-mode power supplies and motor controls. SiC power MOSFETs entered commercial production in 2011, providing rugged, high-efficiency switches for high-frequency power systems. In this wide-ranging book, the authors draw on their considerable experience to present both an introduction to SiC materials, devices, and applications and an in-depth reference for scientists and engineers working in this fast-moving field. Fundamentals of Silicon Carbide Technology covers basic properties of SiC materials, processing technology, theory and analysis of practical devices, and an overview of the most important systems applications. Specifically included are: A complete discussion of SiC material properties, bulk crystal growth, epitaxial growth, device fabrication technology, and characterization techniques. Device physics and operating equations for Schottky diodes, pin diodes, JBS/MPS diodes, JFETs, MOSFETs, BJTs, IGBTs, and thyristors. A survey of power electronics applications, including switch-mode power supplies, motor drives, power converters for electric vehicles, and converters for renewable energy sources. Coverage of special applications, including microwave devices, high-temperature electronics, and rugged sensors. Fully illustrated throughout, the text is written by recognized experts with over 45 years of combined experience in SiC research and development. This book is intended for graduate students and researchers in crystal growth, material science, and semiconductor device technology. The book is also useful for design engineers, application engineers, and product managers in areas such as power supplies, converter and inverter design, electric vehicle technology, high-temperature electronics, sensors, and smart grid technology.