Optical Measurements, Modeling, and Metrology, Volume 5
Optical Measurements, Modeling, and Metrology, Volume 5

Author: Tom Proulx

Publisher: Springer Science & Business Media

Published: 2011-05-27

Total Pages: 412

ISBN-13: 146140228X

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Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; MEMS and Nanotechnology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.

Experimental and Applied Mechanics, Volume 6
Experimental and Applied Mechanics, Volume 6

Author: Nancy Sottos

Publisher: Springer

Published: 2014-08-02

Total Pages: 202

ISBN-13: 3319069896

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Experimental and Applied Mechanics, Volume 6: Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics, the sixth volume of eight from the Conference, brings together contributions to important areas of research and engineering. The collection presents early findings and case studies on a wide range of topics, including: Advances in Residual Stress Measurement Methods Residual Stress Effects on Material Performance Inverse Problems and Hybrid Techniques Thermoelastic Stress Analysis Infrared Techniques Research in Progress Applications in Experimental Mechanics

Microelectronics Manufacturing Diagnostics Handbook
Microelectronics Manufacturing Diagnostics Handbook

Author: Abraham Landzberg

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 663

ISBN-13: 1461520290

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The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.

Processing and Characterization of Magnesium-Based Materials
Processing and Characterization of Magnesium-Based Materials

Author: Domonkos Tolnai

Publisher: MDPI

Published: 2021-08-31

Total Pages: 118

ISBN-13: 3036511024

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Due to their lightweight and high specific strength, Mg-based alloys are considered as substitutes to their heavier counterparts in applications in which corrosion is non-relevant and weight saving is of importance. Furthermore, due to the biocompatibility of Mg, some alloys with controlled corrosion rates are used as degradable implant materials in the medical sector. The typical processing route of Mg parts incorporates a casting step and, subsequently, a thermo–mechanical treatment. In order to achieve the desired macroscopic properties and thus fulfill the service requirements, thorough knowledge of the relationship between the microstructure, the processing steps, and the resulting property profile is necessary. This Special Issue covers in situ and ex situ experimental and computational investigations of the behavior under thermo–mechanical load of Mg-based alloys utilizing modern characterization and simulation techniques. The papers cover investigations on the effect of rare earth additions on the mechanical properties of different Mg alloys, including the effect of long-period stacking-ordered (LPSO) structures, and the experimental and computational investigation of the effect of different processing routes.

Data Modeling for Metrology and Testing in Measurement Science
Data Modeling for Metrology and Testing in Measurement Science

Author: Franco Pavese

Publisher: Springer Science & Business Media

Published: 2008-12-16

Total Pages: 499

ISBN-13: 0817648046

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This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.