ESD Protection Device and Circuit Design for Advanced CMOS Technologies
ESD Protection Device and Circuit Design for Advanced CMOS Technologies

Author: Oleg Semenov

Publisher: Springer Science & Business Media

Published: 2008-04-26

Total Pages: 237

ISBN-13: 1402083017

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ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor industry, the demand for graduates with a basic knowledge of ESD is also increasing. Today, there is a significant demand to educate the circuits design and reliability teams on ESD issues. This book makes an attempt to address the ESD design and implementation in a systematic manner. A design procedure involving device simulators as well as circuit simulator is employed to optimize device and circuit parameters for optimal ESD as well as circuit performance. This methodology, described in ESD Protection Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful ESD circuit design with excellent silicon results and demonstrates its strengths.

ESD in Silicon Integrated Circuits
ESD in Silicon Integrated Circuits

Author: E. Ajith Amerasekera

Publisher: John Wiley & Sons

Published: 2002-05-22

Total Pages: 434

ISBN-13:

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* Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits. * Provides guidance on the implementation of circuit protection measures. * Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts. * Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.

On-Chip ESD Protection for Integrated Circuits
On-Chip ESD Protection for Integrated Circuits

Author: Albert Z.H. Wang

Publisher: Springer Science & Business Media

Published: 2006-01-03

Total Pages: 310

ISBN-13: 0306476185

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This comprehensive and insightful book discusses ESD protection circuit design problems from an IC designer's perspective. On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective provides both fundamental and advanced materials needed by a circuit designer for designing ESD protection circuits, including: Testing models and standards adopted by U.S. Department of Defense, EIA/JEDEC, ESD Association, Automotive Electronics Council, International Electrotechnical Commission, etc. ESD failure analysis, protection devices, and protection of sub-circuits Whole-chip ESD protection and ESD-to-circuit interactions Advanced low-parasitic compact ESD protection structures for RF and mixed-signal IC's Mixed-mode ESD simulation-design methodologies for design prediction ESD-to-circuit interactions, and more! Many real world ESD protection circuit design examples are provided. The book can be used as a reference book for working IC designers and as a textbook for students in the IC design field.

ESD
ESD

Author: Steven H. Voldman

Publisher: John Wiley & Sons

Published: 2015-04-24

Total Pages: 552

ISBN-13: 1118954475

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ESD: Circuits and Devices 2nd Edition provides a clear picture of layout and design of digital, analog, radio frequency (RF) and power applications for protection from electrostatic discharge (ESD), electrical overstress (EOS), and latchup phenomena from a generalist perspective and design synthesis practices providing optimum solutions in advanced technologies. New features in the 2nd edition: Expanded treatment of ESD and analog design of passive devices of resistors, capacitors, inductors, and active devices of diodes, bipolar junction transistors, MOSFETs, and FINFETs. Increased focus on ESD power clamps for power rails for CMOS, Bipolar, and BiCMOS. Co-synthesizing of semiconductor chip architecture and floor planning with ESD design practices for analog, and mixed signal applications Illustrates the influence of analog design practices on ESD design circuitry, from integration, synthesis and layout, to symmetry, matching, inter-digitation, and common centroid techniques. Increased emphasis on system-level testing conforming to IEC 61000-4-2 and IEC 61000-4-5. Improved coverage of low-capacitance ESD, scaling of devices and oxide scaling challenges. ESD: Circuits and Devices 2nd Edition is an essential reference to ESD, circuit & semiconductor engineers and quality, reliability &analysis engineers. It is also useful for graduate and undergraduate students in electrical engineering, semiconductor sciences, microelectronics and IC design.

ESD
ESD

Author: Steven H. Voldman

Publisher: John Wiley & Sons

Published: 2005-12-13

Total Pages: 420

ISBN-13: 0470012900

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This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design across the full range of integrated circuit technologies. ESD Physics and Devices provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. Voldman presents an accessible introduction to the field for engineers and researchers requiring a solid grounding in this important area. The book contains advanced CMOS, Silicon On Insulator, Silicon Germanium, and Silicon Germanium Carbon. In addition it also addresses ESD in advanced CMOS with discussions on shallow trench isolation (STI), Copper and Low K materials. Provides a clear understanding of ESD device physics and the fundamentals of ESD phenomena. Analyses the behaviour of semiconductor devices under ESD conditions. Addresses the growing awareness of the problems resulting from ESD phenomena in advanced integrated circuits. Covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon Germanium) technologies for the first time. Discusses the design and development implications of ESD in semiconductor technologies. An invaluable reference for EMC non-specialist engineers and researchers working in the fields of IC and transistor design. Also, suitable for researchers and advanced students in the fields of device/circuit modelling and semiconductor reliability.

Development of Predictive Analysis Solutions for the ESD Robustness of Integrated Circuits in Advanced CMOS Technologies
Development of Predictive Analysis Solutions for the ESD Robustness of Integrated Circuits in Advanced CMOS Technologies

Author: Benjamin Viale

Publisher:

Published: 2017

Total Pages: 343

ISBN-13:

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As Integrated Circuits (ICs) become more complex and susceptible to ElectroStatic Discharges (ESD), the ability to reliably verify the presence of ESD design weaknesses over a multi-billion transistor chip prior to the tape-out is a major topic in the semiconductor industry. Commercial tools dedicated to Electronic Design Automation (EDA) and related verification flows are in charge of providing checks that have been proven to be efficient for circuits with a mainstream architecture. However, they suffer limitations when confronted with custom designs. Moreover, these verification methods are often run late in the design flow, making any design re-spin costly in terms of corrective efforts and time. This Ph. D. thesis proposes a systematic and scalable ESD verification methodology embodied in a tool called ESD IP Explorer that has been specifically implemented to cover the entire design flow and to comply with custom circuit architectures. It is composed of a recognition module and a verification module. The recognition module first automatically identifies ESD protection structures, embedded in integrated circuits to enhance their ESD hardness, according to a topology-aware recognition mechanism. The verification module then converts the ESD protection network that is formed by ESD protection structures into a directed graph. There, technology-independent and graph-based verification mechanisms perform a chip-scale quasistatic ESD analysis. Machine learning algorithms have been used in order to infer the quasistatic behavior of ESD IPs from the netlist instance parameters of their primary devices. This approach has the advantage that no simulation is required during the execution of ESD IP Explorer, which makes the tool architecture simpler and improves execution times. Implementation efforts pertained to the compliance of ESD IP Explorer with the 28nm Fully Depleted Silicon On Insulator (FD-SOI) technology node. The developed verification tool has been used to successfully analyze a digital and mixed-signal circuit prototype counting more than 1.5 billion transistors in several hours, as well as custom designs that could not be analyzed by means of traditional verification tools due to incompatibility issues.

Nano-CMOS Circuit and Physical Design
Nano-CMOS Circuit and Physical Design

Author: Ban Wong

Publisher: John Wiley & Sons

Published: 2005-04-08

Total Pages: 413

ISBN-13: 0471678864

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Based on the authors' expansive collection of notes taken over the years, Nano-CMOS Circuit and Physical Design bridges the gap between physical and circuit design and fabrication processing, manufacturability, and yield. This innovative book covers: process technology, including sub-wavelength optical lithography; impact of process scaling on circuit and physical implementation and low power with leaky transistors; and DFM, yield, and the impact of physical implementation.

Esd Protection Challenges
Esd Protection Challenges

Author: Steven Thijs

Publisher: LAP Lambert Academic Publishing

Published: 2010-03

Total Pages: 272

ISBN-13: 9783838336428

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Two main Electro Static Discharge (ESD) challenges lie ahead. Firstly, FinFET technology has only a limited available silicon volume to dissipate the ESD current. Secondly, as CMOS technology downscaling allows Radio Frequency (RF) applications to operate at higher RF frequencies and wider bandwidths, adequate ESD protection needs to be developed without compromising RF performance. This book, therefore, provides an in-depth analysis on ESD protection structures and concepts, implemented in silicon on insulator FinFET technology. Complex dependencies are found for the different ESD performance parameters on both device geometry and process technology. Further, in this book, novel RF-ESD protection solutions are proposed for both narrow- and wideband RF CMOS circuits in most advanced CMOS technologies, with a special emphasis towards CDM protection. This analysis should provide fundamental understanding of the ESD challenges for FinFET technology and RF CMOS circuits, and should be especially useful to everyone working with ESD in the field of product development, support, research or education.

Electrostatic Discharge Protection
Electrostatic Discharge Protection

Author: Juin J. Liou

Publisher: CRC Press

Published: 2017-12-19

Total Pages: 378

ISBN-13: 1351830988

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Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.