Electron Beam Interactions with Solids for Microscopy, Microanalysis & Microlithography
Author: David F. Kyser
Publisher: Scanning Electron Microscopy
Published: 1984
Total Pages: 392
ISBN-13:
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Science of Microscopy
Author: P.W. Hawkes
Publisher: Springer Science & Business Media
Published: 2008-08-29
Total Pages: 1336
ISBN-13: 0387497625
DOWNLOAD EBOOKThis fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.
Springer Handbook of Microscopy
Author: Peter W. Hawkes
Publisher: Springer Nature
Published: 2019-11-02
Total Pages: 1561
ISBN-13: 3030000699
DOWNLOAD EBOOKThis book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Cathodoluminescence Microscopy of Inorganic Solids
Author: B.G. Yacobi
Publisher: Springer Science & Business Media
Published: 2013-06-29
Total Pages: 294
ISBN-13: 1475795955
DOWNLOAD EBOOKMicrocharacterization of materials is a rapidly advancing field. Among the many electron and ion probe techniques, the cathodoluminescence mode of an electron probe instrument has reached a certain maturity, which is reflected by an increas ing number of publications in this field. The rapid rate of progress in applications of cathodoluminescence techniques in characterizing inorganic solids has been especially noticeable in recent years. The main purpose of the book is to outline the applications of cath odoluminescence techniques in the assessment of optical and electronic proper ties of inorganic solids, such as semiconductors, phosphors, ceramics, and min erals. The assessment provides, for example, information on impurity levels derived from cathodoluminescence spectroscopy, analysis of dopant concentra tions at a level that, in some cases, is several orders of magnitude lower than that attainable by x-ray microanalysis, the mapping of defects, and the determination of carrier lifetimes and the charge carrier capture cross sections of impurities. In order to make the book self-contained, some basic concepts of solid-state phys ics, as well as various cathodoluminescence techniques and the processes leading to luminescence phenomena in inorganic solids, are also described. We hope that this book will be useful to both scientists and graduate students interested in microcharacterization of inorganic solids. This book, however, was not intended as a definitive account of cathodoluminescence analysis of in organic solids. In considering the results presented here, readers should re member that many materials have properties that vary widely as a function of preparation conditions.
Electron Ionization
Author: Tilmann D. Märk
Publisher: BoD – Books on Demand
Published: 2010
Total Pages: 398
ISBN-13: 3902719575
DOWNLOAD EBOOKX-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK
Author: P.B. Kenway
Publisher: CRC Press
Published: 2020-10-08
Total Pages: 684
ISBN-13: 1000157083
DOWNLOAD EBOOKThe first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.
The Principles and Practice of Electron Microscopy
Author: Ian M. Watt
Publisher: Cambridge University Press
Published: 1997-01-30
Total Pages: 506
ISBN-13: 9780521435918
DOWNLOAD EBOOKThe first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.
A Beginners' Guide to Scanning Electron Microscopy
Author: Anwar Ul-Hamid
Publisher: Springer
Published: 2018-10-26
Total Pages: 422
ISBN-13: 3319984829
DOWNLOAD EBOOKThis book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Electron Impact Ionization
Author: T.D. Märk
Publisher: Springer Science & Business Media
Published: 2013-06-29
Total Pages: 395
ISBN-13: 3709140285
DOWNLOAD EBOOKIt is perhaps surprising that a process which was one of the first to be studied on an atomic scale, and a process which first received attention over seven decades ago, continues to be the object of diverse and intense research efforts. Such is the case with the (seemingly) conceptually simple and familiar mechanism of electron impact ionization of atoms, molecules, and ions. Not only has the multi-body nature of the collision given ground to theoretical effort only grudgingly, but also the variety and subtlety of processes contributing to ionization have helped insure that progress has come only with commensurate work: no pain - no gain. Modern experimental methods have made it possible to effectively measure and explore threshold laws, differential cross sections, partial cross sections, inner-shell ionization, and the ionization of unstable species such as radicals and ions. In most instances the availability of experimental data has provided impetus and guidance for further theoretical progress.
Scanning Electron Microscopy and X-Ray Microanalysis
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
Published: 2012-12-06
Total Pages: 830
ISBN-13: 1461304911
DOWNLOAD EBOOKIn the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
