The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
The proceeding is a collection of research papers presented, at the 9th International Conference on Robotics, Vision, Signal Processing & Power Applications (ROVISP 2016), by researchers, scientists, engineers, academicians as well as industrial professionals from all around the globe to present their research results and development activities for oral or poster presentations. The topics of interest are as follows but are not limited to: • Robotics, Control, Mechatronics and Automation • Vision, Image, and Signal Processing • Artificial Intelligence and Computer Applications • Electronic Design and Applications • Telecommunication Systems and Applications • Power System and Industrial Applications • Engineering Education
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
This book is the inaugural volume in the new Springer series on Learning and Analytics in Intelligent Systems. The series aims at providing, in hard-copy and soft-copy form, books on all aspects of learning, analytics, advanced intelligent systems and related technologies. These disciplines are strongly related and mutually complementary; accordingly, the new series encourages an integrated approach to themes and topics in these disciplines, which will result in significant cross-fertilization, research advances and new knowledge creation. To maximize the dissemination of research findings, the series will publish edited books, monographs, handbooks, textbooks and conference proceedings. This book is intended for professors, researchers, scientists, engineers and students. An extensive list of references at the end of each chapter allows readers to probe further into those application areas that interest them most.
Machine learning is able to solve real-time problems. It has several algorithms such as classification, clustering, and more. To learn these essential algorithms, we require tools like Scikit and TensorFlow. Machine Learning Algorithms Using Scikit and TensorFlow Environments assists researchers in learning and implementing these critical algorithms. Covering key topics such as classification, artificial neural networks, prediction, random forest, and regression analysis, this premier reference source is ideal for industry professionals, computer scientists, researchers, academicians, scholars, practitioners, instructors, and students.
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
