Thermal Expansion

Thermal Expansion

Author: Y. S. Touloukian

Publisher: Springer

Published: 1977

Total Pages: 1812

ISBN-13:

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that about 100 journals are required to yield fifty In 1957, the Thermophysical Properties Research percent. But that other fifty percent! It is scattered Center (TPRC) of Purdue University, under the leadership of its founder, Professor Y. S. Touloukian, through more than 3500 journals and other docu began to develop a coordinated experimental, ments, often items not readily identifiable or ob tainable. Over 85,000 references are now in the theoretical, and literature review program covering a set of properties of great importance to science and files. technology. Over the years, this program has grown Thus, the man who wants to use existing data, rather than make new measurements himself, faces steadily, producing bibliographies, data compila a long and costly task if he wants to assure himself tions and recommendations, experimental measure ments, and other output. The series of volumes for that he has found all the relevant results. More often which these remarks constitute a foreword is one of than not, a search for data stops after one or two results are found-or after the searcher decides he these many important products. These volumes are a monumental accomplishment in themselves, re has spent enough time looking. Now with the quiring for their production the combined knowledge appearance of these volumes, the scientist or engineer and skills of dozens of dedicated specialists. The who needs these kinds of data can consider himself very fortunate.


ASM Ready Reference

ASM Ready Reference

Author: Fran Cverna

Publisher: ASM International

Published: 2002-01-01

Total Pages: 564

ISBN-13: 0871707683

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A quick and easy to use source for qualified thermal properties of metals and alloys. The data tables are arranged by material hierarchy, with summary tables sorted by property value. Values are given for a range of high and low temperatures. Short technical discussions at the beginning of each chapter are designed to refresh the reader's understanding of the properties and units covered in that section


Selected Values of the Crystallographic Properties of Elements

Selected Values of the Crystallographic Properties of Elements

Author: John W. Arblaster

Publisher: ASM International

Published: 2018-03-01

Total Pages: 701

ISBN-13: 1627081550

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This reference book presents a unique and comprehensive review of the crystallographic properties of all the elements and will be a valuable resource for metallurgists and crystallographers. The crystallographic properties of the elements are evaluated at ambient pressure in order to provide a base line for high pressure studies. Lattice parameters of the elements are presented as a function of temperature and related properties such as thermal expansion coefficients, molar volumes, and densities are provided. Special attention is given to ensure that the selected values correspond to the latest values of atomic weights and the fundamental constants. The author, John Arblaster spent his career as a metallurgical chemist analyzing a wide variety of ferrous and non-ferrous metals and alloys in a number of commercial laboratories. He first became interested in crystallography in order to solve the dispute over whether osmium or iridium was the densest metal in the room temperature region. He showed, by proper application of up-to-date input data, that it was in fact osmium. He then produced comprehensive reviews on the crystallographic properties of the six platinum group of metals and has now extended this work to all of the elements.


Thermal Expansion of Solids

Thermal Expansion of Solids

Author: Cho Yen Ho

Publisher: ASM International

Published: 1998-01-01

Total Pages: 330

ISBN-13: 9781615032150

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Provides a detailed examination of theory and techniques in thermal expansion of solids. Subjects include a generalized theory, estimation techniques and selected effects, temperature measurements in solids, thermal expansion by X-ray diffraction, high sensitivity expansivity measurement techniques,