This one volume treatise presents a comprehensive discussion of moire metrology analysis. The authors work from a new point of view, treating the gratings used in moire analysis as an artificial analog to electromagnetic waves, thereby comparing moire analysis with conventional optical methods based on wave properties such as interferometry. It is shown that for every interferometric technique in metrology, there is an analogous technique in moire metrology and vice versa, and that scientists involved in optical metrology have a real choice between interferometric and moire methods.
This one volume treatise presents a comprehensive discussion of moire metrology analysis. The authors work from a new point of view, treating the gratings used in moire analysis as an artificial analog to electromagnetic waves, thereby comparing moire analysis with conventional optical methods based on wave properties such as interferometry. It is shown that for every interferometric technique in metrology, there is an analogous technique in moire metrology and vice versa, and that scientists involved in optical metrology have a real choice between interferometric and moire methods.
Since the first edition of this book was published several new developments have been made in the field of the moiré theory. The most important of these concern new results that have recently been obtained on moiré effects between correlated aperiodic (or random) structures, a subject that was completely absent in the first edition, and which appears now for the first time in a second, separate volume. This also explains the change in the title of the present volume, which now includes the subtitle “Volume I: Periodic Layers”. This subtitle has been added to clearly distinguish the present volume from its new companion, which is subtitled “Volume II: Aperiodic Layers”. It should be noted, however, that the new subtitle of the present volume may be somewhat misleading, since this book also treats (in Chapters 10 and 11) moiré effects between repetitive layers, which are, in fact, geometric transformations of periodic layers, that are generally no longer periodic in themselves. The most suitable subtitle for the present volume would therefore have been “Periodic or Repetitive Layers”, but in the end we have decided on the shorter version.
A description of both the theory and practice of physical measurements that use high-sensitivity moiré - principally moiré interferometry. The focus here is on the mechanics and micromechanics of materials and structural elements and the book includes new studies published for the first time. Diverse fields are addressed: advanced composite materials, thermal stresses, electronic packaging, fracture, metallurgy, time-dependence, strain gage calibration. All the methods can be applied for whole-field measurements on nearly and solid bodies. This reader-friendly book will serve engineers and scientists who are concerned with measurements of real phenomena, while also stimulating students to pursue the treasures of experimental analysis.
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
The discipline of instrumentation has grown appreciably in recent years because of advances in sensor technology and in the interconnectivity of sensors, computers and control systems. This 4e of the Instrumentation Reference Book embraces the equipment and systems used to detect, track and store data related to physical, chemical, electrical, thermal and mechanical properties of materials, systems and operations. While traditionally a key area within mechanical and industrial engineering, understanding this greater and more complex use of sensing and monitoring controls and systems is essential for a wide variety of engineering areas--from manufacturing to chemical processing to aerospace operations to even the everyday automobile. In turn, this has meant that the automation of manufacturing, process industries, and even building and infrastructure construction has been improved dramatically. And now with remote wireless instrumentation, heretofore inaccessible or widely dispersed operations and procedures can be automatically monitored and controlled. This already well-established reference work will reflect these dramatic changes with improved and expanded coverage of the traditional domains of instrumentation as well as the cutting-edge areas of digital integration of complex sensor/control systems. - Thoroughly revised, with up-to-date coverage of wireless sensors and systems, as well as nanotechnologies role in the evolution of sensor technology - Latest information on new sensor equipment, new measurement standards, and new software for embedded control systems, networking and automated control - Three entirely new sections on Controllers, Actuators and Final Control Elements; Manufacturing Execution Systems; and Automation Knowledge Base - Up-dated and expanded references and critical standards
Who has not noticed, on one o~casion or another, those intriguing geometric patterns which appear at the intersection Of repetitive structures such as two far picket fences on a hill, the railings on both sides of a bridge, superposed layers of fabric, or folds of a nylon curtain? This fascinating phenomenon, known as the moire effect, has found useful applications in several fields of science and technology, such as metrology, strain analysis or even document authentication and anti-counterfeiting. However, in other situations moire patterns may have an unwanted, adverse effect. This is the case in the printing world, and, in particular, in the field of colour reproduction: moire patterns which may be caused by the dot-screens used for colour printing may severely deteriorate the image quality and tum into a real printer's nightmare. The starting point of the work on which this book is based was, indeed, in the research of moire phenomena in the context of the colour printing process. The initial aim of this research was to understand the nature and the causes of the superposition moire patterns between regular screens in order to find how to avoid, or at least minimize, their adverse effect on colour printing. This interesting research led us, after all, to a much more far reaching mathematical understanding of the moire phenomenon, whose interest stands in its own right, independently of any particular application.
Since its development in the late 1970s, the Moire Fringe method has become a standard technique for the measurement of the behavior of materials and structures. Edited by one of the co-inventors of the technique, the Handbook of Moire Measurement brings together a series of extended case studies from recognized experts in the field. The emphasis i
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
