Evolution of Thin Film Morphology
Evolution of Thin Film Morphology

Author: Matthew Pelliccione

Publisher: Springer Science & Business Media

Published: 2008-01-29

Total Pages: 206

ISBN-13: 0387751092

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The focus of this book is on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition. It will benefit those working in any discipline that requires an understanding of thin film growth processes.

RHEED Transmission Mode and Pole Figures
RHEED Transmission Mode and Pole Figures

Author: Gwo-Ching Wang

Publisher: Springer Science & Business Media

Published: 2013-12-11

Total Pages: 231

ISBN-13: 1461492874

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This unique book covers the fundamental principle of electron diffraction, basic instrumentation of RHEED, definitions of textures in thin films and nanostructures, mechanisms and control of texture formation, and examples of RHEED transmission mode measurements of texture and texture evolution of thin films and nanostructures. Also presented is a new application of RHEED in the transmission mode called RHEED pole figure technique that can be used to monitor the texture evolution in thin film growth and nanostructures and is not limited to single crystal epitaxial film growth. Details of the construction of RHEED pole figures and the interpretation of observed pole figures are presented. Materials covered include metals, semiconductors, and thin insulators. This book also: Presents a new application of RHEED in the transmission mode Introduces a variety of textures from metals, semiconductors, compound semiconductors, and their characteristics in RHEED pole figures Provides examples of RHEED measurements of texture and texture evolution, construction of RHEED pole figures, and interpretation of observed pole figures RHEED Transmission Mode and Pole Figures: Thin Film and Nanostructure Texture Analysis is ideal for researchers in materials science and engineering and nanotechnology.

Morphological and Compositional Evolution of Thin Films: Volume 749
Morphological and Compositional Evolution of Thin Films: Volume 749

Author: Michael J. Aziz

Publisher: Mrs Proceedings

Published: 2003

Total Pages: 448

ISBN-13:

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"The papers compiled in this volume were presented in Symposium W, 'Morphological and Compositional Evolution of Thin Films, ' held December 2-5 at the 2002 MRS Fall Meeting in Boston Massachusetts. They are organized in the order that they were presented."--P. xiii.

Morphology of Thin Film Growth
Morphology of Thin Film Growth

Author: R. W. Collins

Publisher:

Published: 1992

Total Pages: 4

ISBN-13:

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Thin films prepared by vapor deposition methods have a range of applications which demand control over the microstructural, electronic, and/or optical properties. Empirical classification schemes for the morphology of vapor-deposited thin films have been developed over the years in attempts to provide physical insights into the relationships between preparation parameters and resulting film properties. A variety of computational techniques have also been applied to model film growth and to elucidate, the physical principles that account for the observed morphological development. These include continuum, molecular dynamics, Monte Carlo, and ballistic aggregation techniques. In continuum models of film growth, many authors have studied the stability of one-dimensional surface profiles in response to sinusoidal perturbations of wavelength, lambda r. Effects of finite atomic size and shadowing by asperities have been proposed to enhance the perturbations, whereas adatom surface diffusion damps them. A smooth profile can be regained for lambda r lambda o, where lambda o is the adatom diffusion length. When lambda r lambda o, a modulated profile develops that appears analogous to experimentally-observable columnar morphology. In the experimental situation, clustering associated with initial nucleation is the dominant surface perturbation for thin film deposition on dissimilar substrates. It is technologically important to determine and control the evolution of surface morphology with subsequent film growth. Of direct importance here is the ability to fabricate multilayered structures with smooth interfaces.

Morphological Organization In Epitaxial Growth And Removal
Morphological Organization In Epitaxial Growth And Removal

Author: Max G Lagally

Publisher: World Scientific

Published: 1999-01-29

Total Pages: 508

ISBN-13: 9814496162

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This book provides a critical assessment of the current status and the likely future directions of thin-film growth, an area of exceptional technological importance. Its emphasis is on descriptions of the atomic-scale mechanisms controlling the dynamics and thermodynamics of the morphological evolution of the growth front of thin films in diverse systems of fundamental and technological significance. The book covers most of the original and important conceptual developments made in the 1990s. The articles, written by leading experts, are arranged in five major categories — the theoretical basis, semiconductor-on-semiconductor growth, metal-on-metal growth, metal-on-semiconductor growth, and removal as the inverse process of growth. This book, the only one of its kind in this decade, will prove to be an indispensable reference source for active researchers, those having peripheral interest, and graduate students starting out in the field.

Thin Film Processes II
Thin Film Processes II

Author: Werner Kern

Publisher: Elsevier

Published: 2012-12-02

Total Pages: 881

ISBN-13: 0080524214

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This sequel to the 1978 classic, Thin Film Processes, gives a clear, practical exposition of important thin film deposition and etching processes that have not yet been adequately reviewed. It discusses selected processes in tutorial overviews with implementation guide lines and an introduction to the literature. Though edited to stand alone, when taken together, Thin Film Processes II and its predecessor present a thorough grounding in modern thin film techniques. Provides an all-new sequel to the 1978 classic, Thin Film Processes Introduces new topics, and several key topics presented in the original volume are updated Emphasizes practical applications of major thin film deposition and etching processes Helps readers find the appropriate technology for a particular application

Thin Film Growth
Thin Film Growth

Author: Zexian Cao

Publisher: Elsevier

Published: 2011-07-18

Total Pages: 433

ISBN-13: 0857093290

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Thin film technology is used in many applications such as microelectronics, optics, hard and corrosion resistant coatings and micromechanics, and thin films form a uniquely versatile material base for the development of novel technologies within these industries. Thin film growth provides an important and up-to-date review of the theory and deposition techniques used in the formation of thin films. Part one focuses on the theory of thin film growth, with chapters covering nucleation and growth processes in thin films, phase-field modelling of thin film growth and surface roughness evolution. Part two covers some of the techniques used for thin film growth, including oblique angle deposition, reactive magnetron sputtering and epitaxial growth of graphene films on single crystal metal surfaces. This section also includes chapters on the properties of thin films, covering topics such as substrate plasticity and buckling of thin films, polarity control, nanostructure growth dynamics and network behaviour in thin films. With its distinguished editor and international team of contributors, Thin film growth is an essential reference for engineers in electronics, energy materials and mechanical engineering, as well as those with an academic research interest in the topic. Provides an important and up-to-date review of the theory and deposition techniques used in the formation of thin films Focusses on the theory and modelling of thin film growth, techniques and mechanisms used for thin film growth and properties of thin films An essential reference for engineers in electronics, energy materials and mechanical engineering