The first book to deal with a broad spectrum of process and device design, and modeling issues related to semiconductor devices, bridging the gap between device modelling and process design using TCAD. Presents a comprehensive perspective of emerging fields and covers topics ranging from materials to fabrication, devices, modelling and applications. Aimed at research-and-development engineers and scientists involved in microelectronics technology and device design via Technology CAD, and TCAD engineers and developers.
The 2005 International Technology Roadmap for Semiconductors (ITRS) predicts that the use of Technology computer-aided design (TCAD) will provide as much as a 40 per cent reduction in technology development costs by reducing the number of experimental lots and shortening development time for the semiconductor industry. In a highly competitive manufacturing environment, one needs to take the full advantage of the predictive power of TCAD to reduce cost and time for product development. Currently, process and device simulation has established itself as an indispensable tool for developing and optimising device and microelectronic process technologies in the R & D phase. With the device compact model parameter extraction for circuit analysis, TCAD can be extended into manufacturing for advanced process control and parametric yield analysis. Each chapter ensures coverage of up-to-date TCAD research results for state-of the-art devices and a comprehensive list of seminal references. In summary, this book fills a gap in the literature in a rapidly evolving field, as it blends together a wide ranging description of TCAD activities in Si, SiGe and GaAs materials, technology, device and their applications. An extensive reference list provided in each chapter will help the reader identify the key stages in the development of TCAD from early research through to its integration in current manufacturing
This might be the first book that deals mostly with the 3D technology computer-aided design (TCAD) simulations of major state-of-the-art stress- and strain-engineered advanced semiconductor devices: MOSFETs, BJTs, HBTs, nonclassical MOS devices, finFETs, silicon-germanium hetero-FETs, solar cells, power devices, and memory devices. The book focuses on how to set up 3D TCAD simulation tools, from mask layout to process and device simulation, including design for manufacturing (DFM), and from device modeling to SPICE parameter extraction. The book also offers an innovative and new approach to teaching the fundamentals of semiconductor process and device design using advanced TCAD simulations of various semiconductor structures. The simulation examples chosen are from the most popular devices in use today and provide useful technology and device physics insights. To extend the role of TCAD in today’s advanced technology era, process compact modeling and DFM issues have been included for design–technology interface generation. Unique in approach, this book provides an integrated view of silicon technology and beyond—with emphasis on TCAD simulations. It is the first book to provide a web-based online laboratory for semiconductor device characterization and SPICE parameter extraction. It describes not only the manufacturing practice associated with the technologies used but also the underlying scientific basis for those technologies. Written from an engineering standpoint, this book provides the process design and simulation background needed to understand new and future technology development, process modeling, and design of nanoscale transistors. The book also advances the understanding and knowledge of modern IC design via TCAD, improves the quality in micro- and nanoelectronics R&D, and supports the training of semiconductor specialists. It is intended as a textbook or reference for graduate students in the field of semiconductor fabrication and as a reference for engineers involved in VLSI technology development who have to solve device and process problems. CAD specialists will also find this book useful since it discusses the organization of the simulation system, in addition to presenting many case studies where the user applies TCAD tools in different situations.
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Sun (communication electronics, U. of Hertfordshire, UK), this volume's editor, also contributed a chapter on the architectures and design of OTA/gm-C filters. The other papers describe on-chip automatic tuning of filters, analog adaptive filters, low voltage techniques for switched-current filters, log domain filters, the MOSFET-C technique and active filters using integrated inductors. The contributors teach electrical engineering in the US, the UK, Thailand, and Canada. Annotation copyrighted by Book News, Inc., Portland, OR
This book gives an in-depth account of GaAs, InP and SiGe, technologies and describes all the key techniques for the design of amplifiers, ranging from filters and data converters to image oscillators, mixers, switches, variable attenuators, phase shifters, integrated antennas and complete monolithic transceivers.
This book examines integrated circuits, systems and transceivers for wireless and mobile communications. It covers the most recent developments in key RF, IF, analogue, mixed-signal components and single-chip transceivers in CMOS technology.
"This new book demonstrates the usefulness of the switching function in analyzing power electronic circuits in the steady state. A procedure is suggested for the effective application of this method for the analysis of all types of power electronic circuits."--BOOK JACKET.
This book covers the basic theoretical, algorithmic and real-time aspects of digital signal processing (DSP). Detailed information is provided on off-line, real-time and DSP programming and the reader is effortlessly guided through advanced topics such as DSP hardware design, FIR and IIR filter design and difference equation manipulation.
Vaezi-Nejad (electronics and measurements, U. of Greenwich, London, England) has assembled a textbook that will be useful to graduate students and engineers on advanced solid state and fiber optic sensors, with each chapter written by a specialist in that area, and a lengthy introduction by the editor. The topics covered are: measurement and instrumentation systems based on optical techniques; amplitude, wavelength, phase and polarization modulating sensors; amorphous semiconductor photoreceptors and X-ray image sensors; dielectrophoretic sensors for microbiological applications; electrically conducting polymers for sensing volatile chemicals, and thin film (CIAIPc) phthalocyanine gas sensors. c. Book News Inc.
