Testing at the Speed of Light
Testing at the Speed of Light

Author: National Academies of Sciences, Engineering, and Medicine

Publisher: National Academies Press

Published: 2018-07-08

Total Pages: 89

ISBN-13: 030947079X

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Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

Space-radiation Damage to Electronic Components and Materials
Space-radiation Damage to Electronic Components and Materials

Author: J. E. Drennan

Publisher:

Published: 1966

Total Pages: 65

ISBN-13:

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Space radiation damage to electronic components and materials is of increasing concern as the nation's space capability develops. This report is a general compilation of information and is intended for use by electronic design engineers during early design phases, in making 'ballpark' predictions of expected electronic equipment performance in the space radiation environment. Transistors appear to be the electronic components that will limit space electronic equipment life because of degradation in gain caused by exposure to space radiation. Careful attention to experimental design principles and effective development and exploitation of theoretical and empirical models relating device performance to radiation energy, flux, and fluence are needed. (Author).

Testing at the Speed of Light
Testing at the Speed of Light

Author: National Academies of Sciences, Engineering, and Medicine (U.S.). Committee on Space Radiation Effects Testing Infrastructure for the U.S. Space Program

Publisher:

Published: 2018

Total Pages: 76

ISBN-13: 9780309470803

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"Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future"--Publisher's description

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Author: Ronald D Schrimpf

Publisher: World Scientific

Published: 2004-07-29

Total Pages: 349

ISBN-13: 9814482153

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Spacecraft Environments Interactive
Spacecraft Environments Interactive

Author: National Aeronautics and Space Administration (NASA)

Publisher: Createspace Independent Publishing Platform

Published: 2018-06-11

Total Pages: 36

ISBN-13: 9781721000470

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The natural space environment is characterized by complex and subtle phenomena hostile to spacecraft. Effects of these phenomena impact spacecraft design, development, and operation. Space systems become increasingly susceptible to the space environment as use of composite materials and smaller, faster electronics increases. This trend makes an understanding of space radiation and its effects on electronic systems essential to accomplish overall mission objectives, especially in the current climate of smaller/better/cheaper faster. This primer outlines the radiation environments encountered in space, discusses regions and types of radiation, applies the information to effects that these environments have on electronic systems, addresses design guidelines and system reliability, and stresses the importance of early involvement of radiation specialists in mission planning, system design, and design review (part-by-part verification).Howard, J. W., Jr. and Hardage, D. M.Marshall Space Flight CenterAEROSPACE ENVIRONMENTS; AEROSPACE SYSTEMS; EXTRATERRESTRIAL RADIATION; SPACECRAFT ENVIRONMENTS; ELECTRONIC EQUIPMENT; RADIATION DAMAGE; SYSTEMS ENGINEERING; DESIGN ANALYSIS

Radiation Effects in Advanced Semiconductor Materials and Devices
Radiation Effects in Advanced Semiconductor Materials and Devices

Author: C. Claeys

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 424

ISBN-13: 3662049740

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This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.