Semiconductor Device Reliability
Author: A. Christou
Publisher: Springer
Published: 1990
Total Pages: 606
ISBN-13:
DOWNLOAD EBOOKProceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989
Read and Download eBook Full
Author: A. Christou
Publisher: Springer
Published: 1990
Total Pages: 606
ISBN-13:
DOWNLOAD EBOOKProceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989
Author: Michael Pecht
Publisher: CRC Press
Published: 2017-11-22
Total Pages: 228
ISBN-13: 1351443569
DOWNLOAD EBOOKAchieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This quick reference on semiconductor reliability addresses the key question: How will the understanding of failure mechanisms affect the future? Chapters discuss: failure sites, operational loads, and failure mechanism intrinsic device sensitivities electromigration hot carrier aging time dependent dielectric breakdown mechanical stress induced migration alpha particle sensitivity electrostatic discharge (ESD) and electrical overstress latch-up qualification screening guidelines for designing reliability Guidebook for Managing Silicon Chip Reliability focuses on device failure and causes throughout - providing a thorough framework on how to model the mechanism, test for defects, and avoid and manage damage. It will serve as an exceptional resource for electrical engineers as well as mechanical engineers working in the field of electronic packaging.
Author:
Publisher:
Published: 1999
Total Pages: 179
ISBN-13:
DOWNLOAD EBOOKAuthor: Harzara S. Rathore
Publisher:
Published: 1989
Total Pages: 516
ISBN-13:
DOWNLOAD EBOOKAuthor: Allan H. Johnston
Publisher: World Scientific
Published: 2010
Total Pages: 376
ISBN-13: 981427710X
DOWNLOAD EBOOKThis book discusses reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. Johnston's perspective in the book focuses on high-reliability applications in space, but his discussion of reliability is applicable to high reliability terrestrial applications as well. The book is important because there are new reliability mechanisms present in compound semiconductors that have produced a great deal of confusion. They are complex, and appear to be major stumbling blocks in the application of these types of devices. Many of the reliability problems that were prominent research topics five to ten years ago have been solved, and the reliability of many of these devices has been improved to the level where they can be used for ten years or more with low failure rates. There is also considerable confusion about the way that space radiation affects compound semiconductors. Some optoelectronic devices are so sensitive to damage in space that they are very difficult to use, and have caused failures in operating spacecraft. Others are far more robust. Johnston admirably clarifies the reasons for these differences in this landmark book.
Author: Tho T Vu
Publisher: World Scientific
Published: 2003-04-02
Total Pages: 363
ISBN-13: 9814486434
DOWNLOAD EBOOKThis is the book version of a special issue of the International Journal of High Speed Electronics and Systems, reviewing recent work in the field of compound semiconductor integrated circuits. There are fourteen invited papers covering a wide range of applications, frequencies and materials. These papers deal with digital, analog, microwave and millimeter-wave technologies, devices and integrated circuits for wireline fiber-optic lightwave transmissions, and wireless radio-frequency microwave and millimeter-wave communications. In each case, the market is young and experiencing rapid growth for both commercial and millitary applications. Many new semiconductor technologies compete for these new markets, leading to an alphabet soup of semiconductor materials described in these papers. The book also includes three papers focused on radiation effects and reliability in III-V semiconductor electronics, which are useful for reference and future directions. Moreover, reliability is covered in several papers separately for certain process technologies.
Author: Vladislav A. Vashchenko
Publisher: Springer Science & Business Media
Published: 2008-03-22
Total Pages: 337
ISBN-13: 0387745149
DOWNLOAD EBOOKProviding an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.
Author: Aris Christou
Publisher: RIAC
Published: 2006
Total Pages: 487
ISBN-13: 1933904194
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 1978
Total Pages: 412
ISBN-13:
DOWNLOAD EBOOKAuthor: John E. Shwop
Publisher:
Published: 1962
Total Pages: 428
ISBN-13:
DOWNLOAD EBOOK