Entwicklung von Analysetechniken zur Optimierung der Morphologie organischer Solarzellen

Entwicklung von Analysetechniken zur Optimierung der Morphologie organischer Solarzellen

Author: Klein, Michael

Publisher: KIT Scientific Publishing

Published: 2014-07-20

Total Pages: 220

ISBN-13: 3731500604

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The power conversion efficiency of an organic solar cell is strongly influenced by the morphology of its bulk heterojunction absorber layer. In this thesis new analytical methods are developed and utilized in combination with established methods to characterize various material systems. The common aim of these analyses is to derive a profound understanding of the process-structure relationships and to correlate the findings with the solar cell properties.


Handbook of Deposition Technologies for Films and Coatings

Handbook of Deposition Technologies for Films and Coatings

Author: Peter M. Martin

Publisher: William Andrew

Published: 2009-12-01

Total Pages: 932

ISBN-13: 0815520328

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This 3e, edited by Peter M. Martin, PNNL 2005 Inventor of the Year, is an extensive update of the many improvements in deposition technologies, mechanisms, and applications. This long-awaited revision includes updated and new chapters on atomic layer deposition, cathodic arc deposition, sculpted thin films, polymer thin films and emerging technologies. Extensive material was added throughout the book, especially in the areas concerned with plasma-assisted vapor deposition processes and metallurgical coating applications.


OLED Fundamentals

OLED Fundamentals

Author: Daniel J. Gaspar

Publisher: CRC Press

Published: 2015-05-15

Total Pages: 474

ISBN-13: 1466515198

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A Comprehensive Source for Taking on the Next Stage of OLED R&DOLED Fundamentals: Materials, Devices, and Processing of Organic Light-Emitting Diodes brings together key topics across the field of organic light-emitting diodes (OLEDs), from fundamental chemistry and physics to practical materials science and engineering aspects to design and ma


Strengthening Forensic Science in the United States

Strengthening Forensic Science in the United States

Author: National Research Council

Publisher: National Academies Press

Published: 2009-07-29

Total Pages: 348

ISBN-13: 0309142393

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Scores of talented and dedicated people serve the forensic science community, performing vitally important work. However, they are often constrained by lack of adequate resources, sound policies, and national support. It is clear that change and advancements, both systematic and scientific, are needed in a number of forensic science disciplines to ensure the reliability of work, establish enforceable standards, and promote best practices with consistent application. Strengthening Forensic Science in the United States: A Path Forward provides a detailed plan for addressing these needs and suggests the creation of a new government entity, the National Institute of Forensic Science, to establish and enforce standards within the forensic science community. The benefits of improving and regulating the forensic science disciplines are clear: assisting law enforcement officials, enhancing homeland security, and reducing the risk of wrongful conviction and exoneration. Strengthening Forensic Science in the United States gives a full account of what is needed to advance the forensic science disciplines, including upgrading of systems and organizational structures, better training, widespread adoption of uniform and enforceable best practices, and mandatory certification and accreditation programs. While this book provides an essential call-to-action for congress and policy makers, it also serves as a vital tool for law enforcement agencies, criminal prosecutors and attorneys, and forensic science educators.


Strategy and Methodology for Radioactive Waste Characterization

Strategy and Methodology for Radioactive Waste Characterization

Author: International Atomic Energy Agency

Publisher: IAEA

Published: 2007

Total Pages: 188

ISBN-13:

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Over the past decade significant progress has been achieved in the development of waste characterization and control procedures and equipment as a direct response to ever-increasing requirements for quality and reliability of information on waste characteristics. Failure in control procedures at any step can have important, adverse consequences and may result in producing waste packages which are not compliant with the waste acceptance criteria for disposal, thereby adversely impacting the repository. The information and guidance included in this publication corresponds to recent achievements and reflects the optimum approaches, thereby reducing the potential for error and enhancing the quality of the end product. -- Publisher's description.


Atomic Layer Deposition for Semiconductors

Atomic Layer Deposition for Semiconductors

Author: Cheol Seong Hwang

Publisher: Springer Science & Business Media

Published: 2013-10-18

Total Pages: 266

ISBN-13: 146148054X

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Offering thorough coverage of atomic layer deposition (ALD), this book moves from basic chemistry of ALD and modeling of processes to examine ALD in memory, logic devices and machines. Reviews history, operating principles and ALD processes for each device.


Advances in X-Ray Analysis

Advances in X-Ray Analysis

Author: Charles Barrett

Publisher: Springer

Published: 1971-01-01

Total Pages: 574

ISBN-13: 9780306381140

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The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.


The Conservation of Cave 85 at the Mogao Grottoes, Dunhuang

The Conservation of Cave 85 at the Mogao Grottoes, Dunhuang

Author: Neville Agnew

Publisher: Getty Publications

Published: 2014-02-01

Total Pages: 476

ISBN-13: 1606061577

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The Mogao Grottoes, a World Heritage Site in northwestern China, are located along the ancient caravan routes—collectively known as the Silk Road—that once linked China with the West. Founded by a Buddhist monk in the late fourth century, Mogao flourished over the following millennium, as monks, local rulers, and travelers commissioned hundreds of cave temples cut into a mile-long rock cliff and adorned them with vibrant murals. More than 490 decorated grottoes remain, containing thousands of sculptures and some 45,000 square meters of wall paintings, making Mogao one of the world’s most significant sites of Buddhist art. In 1997 the Getty Conservation Institute, which had been working with the Dunhuang Academy since 1989, began a case study using the Late–Tang dynasty Cave 85 to develop a methodology that would stabilize the deteriorating wall paintings. This abundantly illustrated volume is the definitive report on the project, which was completed in 2010.


X-Ray and Neutron Reflectivity: Principles and Applications

X-Ray and Neutron Reflectivity: Principles and Applications

Author: Jean Daillant

Publisher: Springer Science & Business Media

Published: 2003-07-01

Total Pages: 347

ISBN-13: 3540486968

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The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.