Proceedings: Microscopy and Microanalysis 2002: Volume 8
Proceedings: Microscopy and Microanalysis 2002: Volume 8

Author: Microscopy Society of America

Publisher: Cambridge University Press

Published: 2002-12-16

Total Pages: 556

ISBN-13: 9780521824057

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This Proceedings volume contains extended abstracts of all the papers presented by microscopists in both the materials and life sciences at the Microscopy and Microanalysis 2002 meeting held in Québec City, Québec, Canada on August 4-9, 2002. The Proceedings consists of both a printed volume containing the extended abstracts of all invited papers as well as a searchable CD-ROM containing the extended abstracts of all papers presented at the meeting --whether invited or submitted, platform or poster.

Materials Science Research Trends
Materials Science Research Trends

Author: Lawrence V. Olivante

Publisher: Nova Publishers

Published: 2008

Total Pages: 370

ISBN-13: 9781600216541

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Materials science includes those parts of chemistry and physics that deal with the properties of materials. It encompasses four classes of materials, the study of each of which may be considered a separate field: metals; ceramics; polymers and composites. Materials science is often referred to as materials science and engineering because it has many applications. Industrial applications of materials science include processing techniques (casting, rolling, welding, ion implantation, crystal growth, thin-film deposition, sintering, glassblowing, etc), analytical techniques (electron microscopy, x-ray diffraction, calorimetry, nuclear microscopy (HEFIB) etc.), materials design, and cost/benefit tradeoffs in industrial production of materials. This new book presents new leading-edge research in the field.

The Transmission Electron Microscope
The Transmission Electron Microscope

Author: Khan Maaz

Publisher: BoD – Books on Demand

Published: 2012-04-04

Total Pages: 396

ISBN-13: 9535104500

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The book "The Transmission Electron Microscope" contains a collection of research articles submitted by engineers and scientists to present an overview of different aspects of TEM from the basic mechanisms and diagnosis to the latest advancements in the field. The book presents descriptions of electron microscopy, models for improved sample sizing and handling, new methods of image projection, and experimental methodologies for nanomaterials studies. The selection of chapters focuses on transmission electron microscopy used in material characterization, with special emphasis on both the theoretical and experimental aspect of modern electron microscopy techniques. I believe that a broad range of readers, such as students, scientists and engineers will benefit from this book.

Characterization of Minerals, Metals, and Materials 2015
Characterization of Minerals, Metals, and Materials 2015

Author: John Carpenter

Publisher: Springer

Published: 2016-12-20

Total Pages: 773

ISBN-13: 3319481916

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This collection focuses on the characterization of minerals, metals, and materials as well as the application of characterization results on the processing of these materials. Papers cover topics such as clays, ceramics, composites, ferrous metals, non-ferrous metals, minerals, electronic materials, magnetic materials, environmental materials, advanced materials, and soft materials. In addition, papers covering materials extraction, materials processing, corrosion, welding, solidification, and method development are included. This book provides a current snapshot of characterization in materials science and its role in validating, informing, and driving current theories in the field of materials science. This volume will serve the dual purpose of furnishing a broad introduction of the field to novices while simultaneously serving to keep subject matter experts up-to-date.

Introduction to Focused Ion Beams
Introduction to Focused Ion Beams

Author: Lucille A. Giannuzzi

Publisher: Springer Science & Business Media

Published: 2006-05-18

Total Pages: 362

ISBN-13: 038723313X

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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Characterization of Minerals, Metals, and Materials 2019
Characterization of Minerals, Metals, and Materials 2019

Author: Bowen Li

Publisher: Springer

Published: 2019-02-13

Total Pages: 782

ISBN-13: 3030057496

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This collection gives broad and up-to-date results in the research and development of materials characterization and processing. Topics covered include characterization methods, ferrous materials, non-ferrous materials, minerals, ceramics, polymer and composites, powders, extraction, microstructure, mechanical behavior, processing, corrosion, welding, solidification, magnetic, electronic, environmental, nano-materials, and advanced materials The book explores scientific processes to characterize materials using modern technologies, and focuses on the interrelationships and interdependence among processing, structure, properties, and performance of materials.

ISTFA 2012
ISTFA 2012

Author: ASM International

Publisher: ASM International

Published: 2012

Total Pages: 643

ISBN-13: 1615039953

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Principles of Electron Optics, Volume 3
Principles of Electron Optics, Volume 3

Author: Peter W. Hawkes

Publisher: Academic Press

Published: 2022-02-21

Total Pages: 562

ISBN-13: 0128189800

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Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. - Includes authoritative coverage of the fundamental theory behind electron beams - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement