In-situ Electron Microscopy at High Resolution
In-situ Electron Microscopy at High Resolution

Author: Florian Banhart

Publisher: World Scientific

Published: 2008

Total Pages: 318

ISBN-13: 9812797335

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In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.

In-situ Electron Microscopy
In-situ Electron Microscopy

Author: Gerhard Dehm

Publisher: John Wiley & Sons

Published: 2012-05-29

Total Pages: 403

ISBN-13: 3527319735

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Von den Grundlagen über das Experiment bis zur Anwendung zeigt dieses Buch, wie sich Ionenstrahlanlagen, Rasterelektronenmikroskope und Transmissionselektronenmikroskope zur Beobachtung von Phänomenen bis hinunter zum Nanomaßstab in Echtzeit einsetzen lassen. Nach einem theoretischen Überblick werden experimentelle Verfahren zur Untersuchung von Aufwachsprozessen, Schmelzen, chemischen Reaktionen und Dotierung besprochen; außerdem geht es um die Messung mechanischer, magnetischer, optischer und elektronischer Kenndaten. Der letzte Abschnitt widmet sich Fragen der Soft-Matter-Charakterisierung.

In-situ Electron Microscopy
In-situ Electron Microscopy

Author: Gerhard Dehm

Publisher: John Wiley & Sons

Published: 2012-05-30

Total Pages: 403

ISBN-13: 3527652183

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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

In-situ Electron Microscopy at High Resolution
In-situ Electron Microscopy at High Resolution

Author: Florian Banhart

Publisher: World Scientific

Published: 2008

Total Pages: 318

ISBN-13: 9812797343

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In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.

Springer Handbook of Microscopy
Springer Handbook of Microscopy

Author: Peter W. Hawkes

Publisher: Springer Nature

Published: 2019-11-02

Total Pages: 1561

ISBN-13: 3030000699

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This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

In-Situ Transmission Electron Microscopy
In-Situ Transmission Electron Microscopy

Author: Litao Sun

Publisher: Springer Nature

Published: 2023-03-11

Total Pages: 378

ISBN-13: 9811968454

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This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.

Carbon Nanotube and Related Field Emitters
Carbon Nanotube and Related Field Emitters

Author: Yahachi Saito

Publisher: John Wiley & Sons

Published: 2010-10-01

Total Pages: 551

ISBN-13: 3527632107

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Carbon nanotubes (CNTs) have novel properties that make them potentially useful in many applications in nanotechnology, electronics, optics and other fields of materials science. These characteristics include extraordinary strength, unique electrical properties, and the fact that they are efficient heat conductors. Field emission is the emission of electrons from the surface of a condensed phase into another phase due to the presence of high electric fields. CNT field emitters are expected to make a breakthrough in the development of field emission display technology and enable miniature X-ray sources that will find a wide variety of applications in electronic devices, industry, and medical and security examinations. This first monograph on the topic covers all aspects in a concise yet comprehensive manner - from the fundamentals to applications. Divided into four sections, the first part discusses the preparation and characterization of carbon nanotubes, while part two is devoted to the field emission properties of carbon nanotubes, including the electron emission mechanism, characteristics of CNT electron sources, and dynamic behavior of CNTs during operation. Part three highlights field emission from other nanomaterials, such as carbon nanowalls, diamond, and silicon and zinc oxide nanowires, before concluding with frontier R&D applications of CNT emitters, from vacuum electronic devices such as field emission displays, to electron sources in electron microscopes, X-ray sources, and microwave amplifiers. Edited by a pioneer in the field, each chapter is written by recognized experts in the respective fields.

Transmission Electron Microscopy
Transmission Electron Microscopy

Author: C. Barry Carter

Publisher: Springer

Published: 2016-08-24

Total Pages: 543

ISBN-13: 3319266519

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This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

The Transmission Electron Microscope
The Transmission Electron Microscope

Author: Khan Maaz

Publisher: BoD – Books on Demand

Published: 2015-09-02

Total Pages: 362

ISBN-13: 9535121502

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This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.