Molecular Beam Epitaxy

Molecular Beam Epitaxy

Author: Brian R. Pamplin

Publisher: Elsevier

Published: 2017-08-31

Total Pages: 181

ISBN-13: 1483155331

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Molecular Beam Epitaxy introduces the reader to the use of molecular beam epitaxy (MBE) in the generation of III-V and IV-VI compounds and alloys and describes the semiconductor and integrated optics reasons for using the technique. Topics covered include semiconductor superlattices by MBE; design considerations for MBE systems; periodic doping structure in gallium arsenide (GaAs); nonstoichiometry and carrier concentration control in MBE of compound semiconductors; and MBE techniques for IV-VI optoelectronic devices. The use of MBE to fabricate integrated optical devices and to study semiconductor surface and crystal physics is also considered. This book is comprised of eight chapters and opens with an overview of MBE as a crystal growth technique. The discussion then turns to the deposition of semiconductor superlattices of GaAs by MBE; important factors that must be considered in the design of a MBE system such as flux uniformity, crucible volume, heat shielding, source baffling, and shutters; and control of stoichiometry deviation in MBE growth of compound semiconductors, along with the effects of such deviation on the electronic properties of the grown films. The following chapters focus on the use of MBE techniques for growth of IV-VI optoelectronic devices; for fabrication of integrated optical devices; and for the study of semiconductor surface and crystal physics. The final chapter examines a superlattice consisting of a periodic sequence of ultrathin p- and n-doped semiconductor layers, possibly with intrinsic layers in between. This monograph will be of interest to chemists, physicists, and crystallographers.


Compounds and Alloys Under High Pressure

Compounds and Alloys Under High Pressure

Author: E.Yu Tonkov

Publisher: Taylor & Francis

Published: 2022

Total Pages: 588

ISBN-13: 1351459104

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This is the first book to classify and systematize the available data on the behavior of binary alloys under high pressure. Despite the fact that there is a strong correlation between temperature-composition (T-C) phase diagrams at normal pressure and three- dimensional temperature-composition-pressure (T-C-P) diagrams, many material scientists seldom refer to the (T-C-P) diagrams, just as many high pressure researchers often ignore the data obtained at normal pressure. This book aims to bridge the gap between data obtained at high pressure and that obtained at normal pressure. The most recent research covers not only elements and stoichiometric compounds, but also binary, ternary, and multicomponent alloys, and so this book covers an extended range of substances. The properties of 890 binary systems and a further 1153 pseudobinary and ternary systems are summarized, and accompanied by an extensive bibliography. The data includes information on the solubility of components in solid solutions, melting, and first- and second-order phase transformations in alloys and stoichiometric compounds.


Encyclopedia of Modern Optics

Encyclopedia of Modern Optics

Author: Robert D. Guenther

Publisher: Academic Press

Published: 2005

Total Pages: 522

ISBN-13:

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Unparalleled reference work for all researchers in field of Optics, Fiber Systems, Material Science, Atomic and Molecular Physics, Laser Physics. Covers all the sub fields of Optical Physics as well as related fields as Engineering, which impact manufacturing and many practical applications. Alphabetically arranged for ease of use cross-references to aid in tracking down all aspects of a topic under investigation.


Materials Science and Technology: Strained-Layer Superlattices

Materials Science and Technology: Strained-Layer Superlattices

Author:

Publisher: Academic Press

Published: 1991-02-20

Total Pages: 443

ISBN-13: 0080864309

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The following blurb to be used for the AP Report and ATI only as both volumes will not appear together there.****Strained-layer superlattices have been developed as an important new form of semiconducting material with applications in integrated electro-optics and electronics. Edited by a pioneer in the field, Thomas Pearsall, this volume offers a comprehensive discussion of strained-layer superlattices and focuses on fabrication technology and applications of the material. This volume combines with Volume 32, Strained-Layer Superlattices: Physics, in this series to cover a broad spectrum of topics, including molecular beam epitaxy, quantum wells and superlattices, strain-effects in semiconductors, optical and electrical properties of semiconductors, and semiconductor devices.****The following previously approved blurb is to be used in all other direct mail and advertising as both volumes will be promoted together.****Strained-layer superlattices have been developed as an important new form of semiconducting material with applications in integrated electro-optics and electronics. Edited by a pioneer in the field, Thomas Pearsall, this two-volume survey offers a comprehensive discussion of the physics of strained-layer superlattices (Volume 32), as well as detailing fabrication technology and applications of the material (Volume 33). Although each volume is edited to stand alone, the two books combine to cover a broad spectrum of topics, including molecular beam epitaxy, quantum wells and superlattices, strain-effects in semiconductors, optical and electrical properties of semiconductors, and semiconductor devices.


X-Ray and Neutron Structure Analysis in Materials Science

X-Ray and Neutron Structure Analysis in Materials Science

Author: J. Hasek

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 388

ISBN-13: 1461307678

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During the last few decades, crystallography has become a wide and economically important field of science with many interesting applications in materials research, in different branches of physics, chemistry, geology, pharmacology, biochemistry, electronics, in many technological processes, machinery, heavy industry, etc. Twenty Nobel prizes awarded for achieve ments belonging to thisĀ· field only underline its distinction. Crystallo graphy has become a commonly used term, but - like a whale - it is much easier to recognize than to describe because of an extreme diversity of sub jects involved which range from highly sophisticated theories to the develop ment of routine technological processes or testing of materials in produc tion. It is apparent that only some aspects of selected topics could be included on a single occasion. The conference "ADVANCED METHODS IN X-RAY AND NEUTRON STRUCTURE ANALYSIS OF MATERIALS" held in Karlovy Vary (Czechoslovakia) on October 5-9, 1987, was intended to cover the most important crystallographic aspects of ma terials science. The conference was attended by 250 people from 16 countries (Belgium,Bulgaria, China, Czechoslovakia, Finland, France, FRG, GDR, Hungary, Italy, The Netherlands, Poland, Sweden, USA, USSR and Yugoslavia).