Neutral Atom Imaging Using a Pulsed Electromagnetic Lens

Neutral Atom Imaging Using a Pulsed Electromagnetic Lens

Author: Jamie Ryan Gardner

Publisher: Springer

Published: 2017-10-30

Total Pages: 121

ISBN-13: 3319684302

DOWNLOAD EBOOK

This book describes the design, construction, and characterization of a new type of aberration-corrected, neutral-atom lens. Atom beam control plays a crucial role in many different fields, ranging from fundamental physics research and materials science to applied nanotechnology. Despite this, atom-optical elements like lenses and mirrors remain relatively underdeveloped compared to their counterparts in other optics fields. Although aberration correction is addressed quite comprehensively in photon and electron lenses, no credible research efforts have yet produced the same technology for neutral atoms. It reports on progress towards a neutral atom imaging device that will be useful in a range of applications, including nanofabrication and surface microscopy. It presents a novel technique for improving refractive power and correcting chromatic aberration in atom lenses based on a fundamental paradigm shift from continuous, two-dimensional focusing to a pulsed, three-dimensional approach. Simulations of this system suggest that it will pave the way towards the long-sought goal of true atom imaging on the nanoscale. The book further describes the construction of a prototype lens, and shows that all of the technological requirements for the proposed system are easily satisfied. Using metastable neon from a supersonic source, the prototype was characterized for three different focal lengths and a diverse range of apertures. Despite some manufacturing imperfections, lower distortion and higher resolution than has been shown in any previous hexapole lens was observed. Comparison with simulations corroborates the underlying theory and encourages further refinement of the process.


Transmission Electron Microscopy

Transmission Electron Microscopy

Author: C. Barry Carter

Publisher: Springer

Published: 2016-08-24

Total Pages: 543

ISBN-13: 3319266519

DOWNLOAD EBOOK

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.