Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
What the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used and validated techniques, along with new ideas for solving hard problems. "It is rare that a book can take recent research advances and present them in a form ready for practical use, but this book accomplishes that and more. I am anxious to recommend this in my consulting and to teach a new class to my students." —Dr. Jeff Offutt, professor of software engineering, George Mason University, Fairfax, Virginia, USA "This handbook is the best resource I am aware of on the automated testing of embedded systems. It is thorough, comprehensive, and authoritative. It covers all important technical and scientific aspects but also provides highly interesting insights into the state of practice of model-based testing for embedded systems." —Dr. Lionel C. Briand, IEEE Fellow, Simula Research Laboratory, Lysaker, Norway, and professor at the University of Oslo, Norway "As model-based testing is entering the mainstream, such a comprehensive and intelligible book is a must-read for anyone looking for more information about improved testing methods for embedded systems. Illustrated with numerous aspects of these techniques from many contributors, it gives a clear picture of what the state of the art is today." —Dr. Bruno Legeard, CTO of Smartesting, professor of Software Engineering at the University of Franche-Comté, Besançon, France, and co-author of Practical Model-Based Testing
Graph Theory, Combinatorics and Algorithms: Interdisciplinary Applications focuses on discrete mathematics and combinatorial algorithms interacting with real world problems in computer science, operations research, applied mathematics and engineering. The book contains eleven chapters written by experts in their respective fields, and covers a wide spectrum of high-interest problems across these discipline domains. Among the contributing authors are Richard Karp of UC Berkeley and Robert Tarjan of Princeton; both are at the pinnacle of research scholarship in Graph Theory and Combinatorics. The chapters from the contributing authors focus on "real world" applications, all of which will be of considerable interest across the areas of Operations Research, Computer Science, Applied Mathematics, and Engineering. These problems include Internet congestion control, high-speed communication networks, multi-object auctions, resource allocation, software testing, data structures, etc. In sum, this is a book focused on major, contemporary problems, written by the top research scholars in the field, using cutting-edge mathematical and computational techniques.
For every weapons system being developed, the U.S. Department of Defense (DOD) must make a critical decision: Should the system go forward to full-scale production? The answer to that question may involve not only tens of billions of dollars but also the nation's security and military capabilities. In the milestone process used by DOD to answer the basic acquisition question, one component near the end of the process is operational testing, to determine if a system meets the requirements for effectiveness and suitability in realistic battlefield settings. Problems discovered at this stage can cause significant production delays and can necessitate costly system redesign. This book examines the milestone process, as well as the DOD's entire approach to testing and evaluating defense systems. It brings to the topic of defense acquisition the application of scientific statistical principles and practices.
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
This book constitutes the refereed proceedings of the 16th International Conference on Model Driven Engineering Languages and Systems, MODELS 2013, held in Miami, FL, USA, in September/October 2013. The 47 full papers presented in this volume were carefully reviewed and selected from a total of 180 submissions. They are organized in topical sections named: tool support; dependability; comprehensibility; testing; evolution; verification; product lines; semantics; domain-specific modeling languages; models@RT; design and architecture; model transformation; model analysis; and system synthesis.
Systems' Verification Validation and Testing (VVT) are carried out throughout systems' lifetimes. Notably, quality-cost expended on performing VVT activities and correcting system defects consumes about half of the overall engineering cost. Verification, Validation and Testing of Engineered Systems provides a comprehensive compendium of VVT activities and corresponding VVT methods for implementation throughout the entire lifecycle of an engineered system. In addition, the book strives to alleviate the fundamental testing conundrum, namely: What should be tested? How should one test? When should one test? And, when should one stop testing? In other words, how should one select a VVT strategy and how it be optimized? The book is organized in three parts: The first part provides introductory material about systems and VVT concepts. This part presents a comprehensive explanation of the role of VVT in the process of engineered systems (Chapter-1). The second part describes 40 systems' development VVT activities (Chapter-2) and 27 systems' post-development activities (Chapter-3). Corresponding to these activities, this part also describes 17 non-testing systems' VVT methods (Chapter-4) and 33 testing systems' methods (Chapter-5). The third part of the book describes ways to model systems' quality cost, time and risk (Chapter-6), as well as ways to acquire quality data and optimize the VVT strategy in the face of funding, time and other resource limitations as well as different business objectives (Chapter-7). Finally, this part describes the methodology used to validate the quality model along with a case study describing a system's quality improvements (Chapter-8). Fundamentally, this book is written with two categories of audience in mind. The first category is composed of VVT practitioners, including Systems, Test, Production and Maintenance engineers as well as first and second line managers. The second category is composed of students and faculties of Systems, Electrical, Aerospace, Mechanical and Industrial Engineering schools. This book may be fully covered in two to three graduate level semesters; although parts of the book may be covered in one semester. University instructors will most likely use the book to provide engineering students with knowledge about VVT, as well as to give students an introduction to formal modeling and optimization of VVT strategy.
This easy to read text provides a broad introduction to the fundamental concepts of modeling and simulation (M&S) and systems engineering, highlighting how M&S is used across the entire systems engineering lifecycle. Features: reviews the full breadth of technologies, methodologies and uses of M&S, rather than just focusing on a specific aspect of the field; presents contributions from specialists in each topic covered; introduces the foundational elements and processes that serve as the groundwork for understanding M&S; explores common methods and methodologies used in M&S; discusses how best to design and execute experiments, covering the use of Monte Carlo techniques, surrogate modeling and distributed simulation; explores the use of M&S throughout the systems development lifecycle, describing a number of methods, techniques, and tools available to support systems engineering processes; provides a selection of case studies illustrating the use of M&S in systems engineering across a variety of domains.
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Automotive systems engineering addresses the system throughout its life cycle, including requirement, specification, design, implementation, verification and validation of systems, modeling, simulation, testing, manufacturing, operation and maintenance. This book - the third in a series of four volumes on this subject - features 11 papers, published between 1999-2010, that address the challenges and importance of systems modeling, stressing the use of advanced tools and approaches. Topics covered include: Automotive systems modeling Model-based design culture Applications
