Reliability of Photonics Materials and Structures

Reliability of Photonics Materials and Structures

Author: Ephraim Suhir

Publisher:

Published: 1998

Total Pages: 448

ISBN-13:

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Discusses the application of computer-aided and analytical methods and approaches of materials science and engineering mechanics to evaluating and assuring the short-term and long-term reliability of materials and structures in photonics engineering. The main concern is the mechanical reliability of the system and the impact of the mechanical behavior of photonics material and structures on the system's optical performance. The 49 papers cover general problems, strength degradation, fatigue and ageing in the materials, the structural analysis and modelling of the mechanical behavior, high- strength and metallized fibers, performance in harsh environments, and the reliability of devices. Annotation copyrighted by Book News, Inc., Portland, OR


Diffusion Processes in Advanced Technological Materials

Diffusion Processes in Advanced Technological Materials

Author: Devendra Gupta

Publisher: Springer Science & Business Media

Published: 2013-01-15

Total Pages: 552

ISBN-13: 9780080947082

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This new game book for understanding atoms at play aims to document diffusion processes and various other properties operative in advanced technological materials. Diffusion in functional organic chemicals, polymers, granular materials, complex oxides, metallic glasses, and quasi-crystals among other advanced materials is a highly interactive and synergic phenomenon. A large variety of atomic arrangements are possible. Each arrangement affects the performance of these advanced, polycrystalline multiphase materials used in photonics, MEMS, electronics, and other applications of current and developing interest. This book is written by pioneers in industry and academia for engineers, chemists, and physicists in industry and academia at the forefront of today's challenges in nanotechnology, surface science, materials science, and semiconductors.


IUTAM Symposium on Multiscale Modeling and Characterization of Elastic-Inelastic Behavior of Engineering Materials

IUTAM Symposium on Multiscale Modeling and Characterization of Elastic-Inelastic Behavior of Engineering Materials

Author: S. Ahzi

Publisher: Springer Science & Business Media

Published: 2013-04-17

Total Pages: 442

ISBN-13: 940170483X

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The papers in this proceeding are a collection of the works presented at the IUTAM symposium-Marrakech 2002 (October 20-25) which brought together scientists from various countries. These papers cover contemporary topics in multiscale modeling and characterization of materials behavior of engineering materials. They were selected to focus on topics related to deformation and failure in metals, alloys, intermetallics and polymers including: experimental techniques, deformation and failure mechanisms, dislocation-based modelling, microscopic-macroscopic averaging schemes, application to forming processes and to phase transformation, localization and failure phenomena, and computational advances. Key areas that are covered by some of the papers include modeling of material deformation at various scales. At the atomistic scale, results from MD simulations pertaining to deformation mechanisms in nano-crystalline materials as well as dislocation-defect interactions are presented. Advances in modeling of deformation in metals using discrete dislocation analyses are also presented, providing an insight into this emerging scientific technique that can be used to model deformation at the microscale. These papers address current engineering problems, including deformation of thin fIlms, dislocation behavior and strength during nanoindentation, strength in metal matrix composites, dislocation-crack interaction, development of textures in polycrystals, and problems involving twining and shape memory behavior. On Behalf of the organizing committee, I would like to thank Professor P.


Microelectromechanical Structures for Materials Research

Microelectromechanical Structures for Materials Research

Author: Stuart B. Brown

Publisher:

Published: 1998

Total Pages: 272

ISBN-13:

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Reports recent developments in a field that is coalescing but still lacks the coherence or certainty of a mature discipline in terms of accepted methodologies. The 39 papers discuss the resonance method as an attractive way to evaluate mechanical properties of thin gold films, heating effects on the Young's modulus of films sputtered onto micromachined resonators, test methods for characterizing piezoelectric thin films, polysilicon tensile testing with electrostatic gripping, silicon-based epitaxial films, and other aspects. Annotation copyrighted by Book News, Inc., Portland, OR