Low-Temperature Microscopy and Analysis
Low-Temperature Microscopy and Analysis

Author: Patrick Echlin

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 553

ISBN-13: 1489923020

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The frozen-hydrated specimen is the principal element that unifies the subject of low temperature microscopy, and frozen-hydrated specimens are what this book is all about. Freezing the sample as quickly as possible and then further preparing the specimen for microscopy or microanalysis, whether still embedded in ice or not: there seem to be as many variations on this theme as there are creative scientists with problems of structure and composition to investigate. Yet all share a body of com mon fact and theory upon which their work must be based. Low-Temperature Micros copy and Analysis provides, for the first time, a comprehensive treatment of all the elements to which one needs access. What is the appeal behind the use of frozen-hydrated specimens for biological electron microscopy, and why is it so important that such a book should now have been written? If one cannot observe dynamic events as they are in progress, rapid specimen freezing at least offers the possibility to trap structures, organelles, macro molecules, or ions and other solutes in a form that is identical to what the native structure was like at the moment of trapping. The pursuit of this ideal becomes all the more necessary in electron microscopy because of the enormous increase in resolution that is available with electron-optical instruments, compared to light optical microscopes.

Biomedical Electron Microscopy
Biomedical Electron Microscopy

Author: Arvid B. Maunsbach

Publisher: Elsevier

Published: 1998-11-03

Total Pages: 569

ISBN-13: 0080528090

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This comprehensive reference illustrates optimal preparation methods in biological electron microscopy compared with common methodological problems. Not only will the basic methodologies of transmission electron microscopy like fixation, microtomy, and microscopy be presented, but the authors also endeavor to illustrate more specialized techniques such as negative staining, autoradiography, cytochemistry, immunoelectron microscopy, and computer-assisted image analysis. - Authored by the key leaders in the biological electron microscopy field - Illustrates both optimal and suboptimal or artifactual results in a variety of electron microscopy disciplines - Introduces students on how to read and interpret electron micrographs

Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997
Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997

Author: Rodenburg

Publisher: CRC Press

Published: 1997-01-01

Total Pages: 716

ISBN-13: 9780750304412

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Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.

The Principles and Practice of Electron Microscopy
The Principles and Practice of Electron Microscopy

Author: Ian M. Watt

Publisher: Cambridge University Press

Published: 1997-01-30

Total Pages: 506

ISBN-13: 9780521435918

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The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.

Negative Staining and Cryoelectron Microscopy
Negative Staining and Cryoelectron Microscopy

Author: 0 J.R. Harris,

Publisher: Taylor & Francis

Published: 2023-05-09

Total Pages: 204

ISBN-13: 1000948943

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Since the start of biological studies using the transmission electron microscope scientists have sought to develop procedures for the preparation and investigation of the thinly spread specimens of biological particulates. Negative Staining and Cryoelect

Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis

Author: Joseph Goldstein

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 679

ISBN-13: 1461332737

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This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Matter and Methods at Low Temperatures
Matter and Methods at Low Temperatures

Author: Frank Pobell

Publisher: Springer Science & Business Media

Published: 2013-04-17

Total Pages: 328

ISBN-13: 366208578X

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The aim of this book is to provide information about performing experi ments at low temperatures, as well as basic facts concerning the low tem perature properties of liquid and solid matter. To orient the reader, I begin with chapters on these low temperature properties. The major part of the book is then devoted to refrigeration techniques and to the physics on which they are based. Of equal importance, of course, are the definition and measurement of temperature; hence low temperature thermometry is extensively discussed in subsequent chapters. Finally, I describe a variety of design and construction techniques which have turned out to be useful over the years. The content of the book is based on the three-hour-per-week lecture course which I have given several times at the University of Bayreuth between 1983 and 1991. It should be particularly suited for advanced stu dents whose intended masters (diploma) or Ph.D. subject is experimental condensed matter physics at low temperatures. However, I believe that the book will also be of value to experienced scientists, since it describes sev eral very recent advances in experimental low temperature physics and technology, for example, new developments in nuclear refrigeration and thermometry.

An Introduction to Molecular Biotechnology
An Introduction to Molecular Biotechnology

Author: Michael Wink

Publisher: John Wiley & Sons

Published: 2020-12-03

Total Pages: 544

ISBN-13: 3527812865

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Completely updated in line with the rapid progress made in the field, this new edition of the highly-praised textbook addresses powerful new methods and concepts in biotechnology, such as genome editing, reprogrammed stem cells, and personalized medicine. An introduction to the fundamentals in molecular and cell biology is followed by a description of standard techniques, including purification and analysis of biomolecules, cloning techniques, gene expression systems, genome editing methods, labeling of proteins and in situ-techniques, standard and high resolution microscopy. The third part focuses on key areas in research and application, ranging from functional genomics, proteomics and bioinformatics to drug targeting, recombinant antibodies and systems biology. The final part looks at the biotechnology industry, explaining intellectual property issues, legal frameworks for pharmaceutical products and the interplay between start-up and larger companies. The contents are beautifully illustrated throughout, with hundreds of full color diagrams and photographs. Provides students and professionals in life sciences, pharmacy and biochemistry with everything they need to know about molecular biotechnology.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Author: Patrick Echlin

Publisher: Springer Science & Business Media

Published: 2011-04-14

Total Pages: 329

ISBN-13: 0387857311

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Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.