Interpretation of Electron Diffraction Patterns
Author: Kenneth William Andrews
Publisher: Springer
Published: 2013-11-21
Total Pages: 198
ISBN-13: 1489964754
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Author: Kenneth William Andrews
Publisher: Springer
Published: 2013-11-21
Total Pages: 198
ISBN-13: 1489964754
DOWNLOAD EBOOKAuthor: P.E. Champness
Publisher: Springer Science & Business Media
Published: 2012-12-06
Total Pages: 574
ISBN-13: 3642661963
DOWNLOAD EBOOKDuring the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.
Author: Ayahiko Ichimiya
Publisher: Cambridge University Press
Published: 2004-12-13
Total Pages: 370
ISBN-13: 9780521453738
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Author: Jeffrey William Edington
Publisher: Palgrave
Published: 1975
Total Pages: 122
ISBN-13: 9780333182925
DOWNLOAD EBOOKAuthor: Jian Min Zuo
Publisher: Springer
Published: 2016-10-26
Total Pages: 741
ISBN-13: 1493966073
DOWNLOAD EBOOKThis volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Author: C. Barry Carter
Publisher: Springer
Published: 2016-08-24
Total Pages: 543
ISBN-13: 3319266519
DOWNLOAD EBOOKThis text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Author: L.-M. Peng
Publisher: Oxford University Press, USA
Published: 2004
Total Pages: 580
ISBN-13: 9780198500742
DOWNLOAD EBOOKThis book is an in-depth treatment of the theoretical background relevant to an understanding of materials that can be obtained by using high-energy electron diffraction and microscopy.
Author: Milos Janecek
Publisher: BoD – Books on Demand
Published: 2016-02-18
Total Pages: 302
ISBN-13: 9535122525
DOWNLOAD EBOOKThis book brings a broad review of recent global developments in theory, instrumentation, and practical applications of electron microscopy. It was created by 13 contributions from experts in different fields of electron microscopy and technology from over 20 research institutes worldwide.
Author: John Maxwell Cowley
Publisher: Oxford University Press
Published: 1992
Total Pages: 442
ISBN-13: 9780198557333
DOWNLOAD EBOOKVolume 2 deals with those aspects when there is a stronger correlation of the diffraction phenomena with the electron microscope imaging.
Author: Ludwig Reimer
Publisher: Springer
Published: 2013-11-11
Total Pages: 532
ISBN-13: 3662135531
DOWNLOAD EBOOKThe aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.