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Author: Clyde Briant
Publisher: Routledge
Published: 2017-09-29
Total Pages: 328
ISBN-13: 1351439065
DOWNLOAD EBOOKProvides a state-of-the-art account of the various effects of impurities on the properties of engineering alloys. Outlines a wide range of methods for producing cleaner alloys. Traces the technological advances that allow the economical manufacture of purer materials.
Author: Clyde Briant
Publisher: Routledge
Published: 2017-09-29
Total Pages: 319
ISBN-13: 1351439073
DOWNLOAD EBOOKProvides a state-of-the-art account of the various effects of impurities on the properties of engineering alloys. Outlines a wide range of methods for producing cleaner alloys. Traces the technological advances that allow the economical manufacture of purer materials.
Author:
Publisher:
Published: 2015
Total Pages:
ISBN-13: 9781781546628
DOWNLOAD EBOOKAuthor: Yutaka Yoshida
Publisher: Springer
Published: 2016-03-30
Total Pages: 498
ISBN-13: 4431558004
DOWNLOAD EBOOKThis book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.
Author: Klaus Graff
Publisher: Springer Science & Business Media
Published: 2013-03-08
Total Pages: 228
ISBN-13: 3642975933
DOWNLOAD EBOOKA discussion of the different mechanisms responsible for contamination together with a survey of their impact on device performance. The author examines the specific properties of main and rare impurities in silicon, as well as the detection methods and requirements in modern technology. Finally, impurity gettering is studied along with modern techniques to determine gettering efficiency. Throughout all of these subjects, the book presents only reliable and up-to-date data so as to provide a thorough review of recent scientific investigations.
Author: Cor Claeys
Publisher: Springer
Published: 2018-08-13
Total Pages: 464
ISBN-13: 3319939254
DOWNLOAD EBOOKThis book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
Author: Victor I. Fistul
Publisher: CRC Press
Published: 2004-01-27
Total Pages: 448
ISBN-13: 0203299256
DOWNLOAD EBOOKAlthough there is a good deal of research concerning semiconductor impurities available, most publications on the subject are very specialized and very theoretical. Until now, the field lacked a text that described the current experimental data, applications, and theory concerning impurities in semiconductor physics. Impurities in Semicondu
Author: Robert Benjamin Leighou
Publisher:
Published: 1925
Total Pages: 568
ISBN-13:
DOWNLOAD EBOOKAuthor: C S Indulkar
Publisher: S. Chand Publishing
Published: 2008
Total Pages: 393
ISBN-13: 8121906660
DOWNLOAD EBOOKA Textbook for the students of B.Sc.(Engg.), B.E., B.Tech., AMIE and Diploma Courses. A new chapter on ""Semiconductor Fabrication Technology and Miscellaneous Semiconductor Devices"" had been included and additional self-assessment questions with answers and additional worked examples had been provided at the end of the BOOK.
Author: Zbigniew D. Jastrzebski
Publisher: John Wiley & Sons
Published: 1976
Total Pages: 890
ISBN-13:
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