GaN, AIN, InN and Their Alloys
Author:
Publisher:
Published: 2004
Total Pages: 816
ISBN-13:
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Author:
Publisher:
Published: 2004
Total Pages: 816
ISBN-13:
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Publisher: Newnes
Published: 2011-01-28
Total Pages: 3572
ISBN-13: 0080932282
DOWNLOAD EBOOKSemiconductors are at the heart of modern living. Almost everything we do, be it work, travel, communication, or entertainment, all depend on some feature of semiconductor technology. Comprehensive Semiconductor Science and Technology, Six Volume Set captures the breadth of this important field, and presents it in a single source to the large audience who study, make, and exploit semiconductors. Previous attempts at this achievement have been abbreviated, and have omitted important topics. Written and Edited by a truly international team of experts, this work delivers an objective yet cohesive global review of the semiconductor world. The work is divided into three sections. The first section is concerned with the fundamental physics of semiconductors, showing how the electronic features and the lattice dynamics change drastically when systems vary from bulk to a low-dimensional structure and further to a nanometer size. Throughout this section there is an emphasis on the full understanding of the underlying physics. The second section deals largely with the transformation of the conceptual framework of solid state physics into devices and systems which require the growth of extremely high purity, nearly defect-free bulk and epitaxial materials. The last section is devoted to exploitation of the knowledge described in the previous sections to highlight the spectrum of devices we see all around us. Provides a comprehensive global picture of the semiconductor world Each of the work's three sections presents a complete description of one aspect of the whole Written and Edited by a truly international team of experts
Author: Kiyoshi Takahashi
Publisher: Springer Science & Business Media
Published: 2007-04-12
Total Pages: 481
ISBN-13: 3540472355
DOWNLOAD EBOOKThis book offers a comprehensive overview of the development, current state, and future prospects of wide bandgap semiconductor materials and related optoelectronics devices. With 901 references, 333 figures and 21 tables, this book will serve as a one-stop source of knowledge on wide bandgap semiconductors and related optoelectronics devices.
Author: Martin Kuball
Publisher:
Published: 2006-03-27
Total Pages: 896
ISBN-13:
DOWNLOAD EBOOKThe MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: Materials Research Society. Meeting
Publisher:
Published: 2005
Total Pages: 480
ISBN-13:
DOWNLOAD EBOOKAuthor: Carl Bernard Poitras
Publisher:
Published: 2006
Total Pages: 234
ISBN-13:
DOWNLOAD EBOOKAuthor: Materials Research Society. Meeting
Publisher:
Published: 2005-11-08
Total Pages: 552
ISBN-13:
DOWNLOAD EBOOKThe MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: Materials Research Society. Meeting
Publisher:
Published: 2005-11-09
Total Pages: 580
ISBN-13:
DOWNLOAD EBOOKThe MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: Materials Research Society. Meeting
Publisher:
Published: 2005
Total Pages: 240
ISBN-13:
DOWNLOAD EBOOKAuthor: A. Kumar
Publisher:
Published: 2005-07-19
Total Pages: 330
ISBN-13:
DOWNLOAD EBOOKTechnology requirements associated with the progressive scaling of devices for future technology nodes, coupled with the aggressive introduction of new materials, places tremendous demands on chemical-mechanical polishing. The goal of this 2005 book, which is part of a popular series from MRS, is to bring together experts from a broad spectrum of research and technology groups currently working on CMP, to review advances made, and to offer a comprehensive discussion of future challenges that must be overcome. The book shows trends in the development of consumables, process modules, tool designs, process integration, modeling, defect characterization, and metrology. Topics include: planarization processes and applications; consumables -CMP pads and slurries; CMP equipment and metrology; and CMP modeling and simulation.