8th RILEM International Symposium on Testing and Characterization of Sustainable and Innovative Bituminous Materials

8th RILEM International Symposium on Testing and Characterization of Sustainable and Innovative Bituminous Materials

Author: Francesco Canestrari

Publisher: Springer

Published: 2015-09-24

Total Pages: 1024

ISBN-13: 9401773424

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This work presents the results of RILEM TC 237-SIB (Testing and characterization of sustainable innovative bituminous materials and systems). The papers have been selected for publication after a rigorous peer review process and will be an invaluable source to outline and clarify the main directions of present and future research and standardization for bituminous materials and pavements. The following topics are covered: - Characterization of binder-aggregate interaction - Innovative testing of bituminous binders, additives and modifiers - Durability and aging of asphalt pavements - Mixture design and compaction analysis - Environmentally sustainable materials and technologies - Advances in laboratory characterization of bituminous materials - Modeling of road materials and pavement performance prediction - Field measurement and in-situ characterization - Innovative materials for reinforcement and interlayer systems - Cracking and damage characterization of asphalt pavements - Recycling and re-use in road pavements This is the proceedings of the RILEM SIB2015 Symposium (Ancona, Italy, October 7-9, 2015).


Dependability in Electronic Systems

Dependability in Electronic Systems

Author: Nobuyasu Kanekawa

Publisher: Springer Science & Business Media

Published: 2010-11-08

Total Pages: 226

ISBN-13: 144196715X

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This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.


Innovative Algorithms and Techniques in Automation, Industrial Electronics and Telecommunications

Innovative Algorithms and Techniques in Automation, Industrial Electronics and Telecommunications

Author: Tarek Sobh

Publisher: Springer Science & Business Media

Published: 2007-09-04

Total Pages: 529

ISBN-13: 1402062664

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This book includes a set of rigorously reviewed world-class manuscripts addressing and detailing state-of-the-art research projects in the areas of Industrial Electronics, Technology, Automation, Telecommunications and Networking. The book includes selected papers from the conference proceedings of the International Conference on Industrial Electronics, Technology, Automation (IETA 2006) and International Conference on Telecommunications and Networking (TeNe 06).


On-Line Testing for VLSI

On-Line Testing for VLSI

Author: Michael Nicolaidis

Publisher: Springer Science & Business Media

Published: 2013-03-09

Total Pages: 152

ISBN-13: 1475760698

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Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.


Author:

Publisher: IOS Press

Published:

Total Pages: 10439

ISBN-13:

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A Process for Developing a Common Vocabulary in the Information Security Area

A Process for Developing a Common Vocabulary in the Information Security Area

Author: Jan V. Knop

Publisher: IOS Press

Published: 2007

Total Pages: 120

ISBN-13: 1586037560

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Since the cyber attacks are made with the use of global informational infrastructure they could be organized from every part of the planet, which means that we can only resist them with the help of international cooperation. There is a need to harmonize different languages in which specialists speak in order to guarantee the information security.