Fault-Tolerant Design

Fault-Tolerant Design

Author: Elena Dubrova

Publisher: Springer Science & Business Media

Published: 2013-03-15

Total Pages: 195

ISBN-13: 1461421136

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This textbook serves as an introduction to fault-tolerance, intended for upper-division undergraduate students, graduate-level students and practicing engineers in need of an overview of the field. Readers will develop skills in modeling and evaluating fault-tolerant architectures in terms of reliability, availability and safety. They will gain a thorough understanding of fault tolerant computers, including both the theory of how to design and evaluate them and the practical knowledge of achieving fault-tolerance in electronic, communication and software systems. Coverage includes fault-tolerance techniques through hardware, software, information and time redundancy. The content is designed to be highly accessible, including numerous examples and exercises. Solutions and powerpoint slides are available for instructors.


Fault-Tolerant Systems

Fault-Tolerant Systems

Author: Israel Koren

Publisher: Elsevier

Published: 2010-07-19

Total Pages: 399

ISBN-13: 0080492681

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Fault-Tolerant Systems is the first book on fault tolerance design with a systems approach to both hardware and software. No other text on the market takes this approach, nor offers the comprehensive and up-to-date treatment that Koren and Krishna provide. This book incorporates case studies that highlight six different computer systems with fault-tolerance techniques implemented in their design. A complete ancillary package is available to lecturers, including online solutions manual for instructors and PowerPoint slides. Students, designers, and architects of high performance processors will value this comprehensive overview of the field. - The first book on fault tolerance design with a systems approach - Comprehensive coverage of both hardware and software fault tolerance, as well as information and time redundancy - Incorporated case studies highlight six different computer systems with fault-tolerance techniques implemented in their design - Available to lecturers is a complete ancillary package including online solutions manual for instructors and PowerPoint slides


Patterns for Fault Tolerant Software

Patterns for Fault Tolerant Software

Author: Robert S. Hanmer

Publisher: John Wiley & Sons

Published: 2013-07-12

Total Pages: 272

ISBN-13: 1118351541

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Software patterns have revolutionized the way developer’s and architects think about how software is designed, built and documented. This new title in Wiley’s prestigious Series in Software Design Patterns presents proven techniques to achieve patterns for fault tolerant software. This is a key reference for experts seeking to select a technique appropriate for a given system. Readers are guided from concepts and terminology, through common principles and methods, to advanced techniques and practices in the development of software systems. References will provide access points to the key literature, including descriptions of exemplar applications of each technique. Organized into a collection of software techniques, specific techniques can be easily found with sufficient detail to allow appropriate choices for the system being designed.


Fault-tolerant Control Systems

Fault-tolerant Control Systems

Author: Hassan Noura

Publisher: Springer Science & Business Media

Published: 2009-07-30

Total Pages: 233

ISBN-13: 1848826532

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The seriesAdvancesinIndustrialControl aims to report and encourage te- nologytransfer in controlengineering. The rapid development of controlte- nology has an impact on all areas of the control discipline. New theory, new controllers, actuators, sensors, new industrial processes, computer methods, new applications, new philosophies. . . , new challenges. Much of this devel- ment work resides in industrial reports, feasibility study papers, and the - ports of advanced collaborative projects. The series o?ers an opportunity for researchers to present an extended exposition of such new work in all aspects of industrial control for wider and rapid dissemination. Control system design and technology continues to develop in many d- ferent directions. One theme that the Advances in Industrial Control series is following is the application of nonlinear control design methods, and the series has some interesting new commissions in progress. However, another theme of interest is how to endow the industrial controller with the ability to overcome faults and process degradation. Fault detection and isolation is a broad ?eld with a research literature spanning several decades. This topic deals with three questions: • How is the presence of a fault detected? • What is the cause of the fault? • Where is it located? However, there has been less focus on the question of how to use the control system to accommodate and overcome the performance deterioration caused by the identi?ed sensor or actuator fault.


Diagnosis and Fault-Tolerant Control

Diagnosis and Fault-Tolerant Control

Author: Mogens Blanke

Publisher: Springer Science & Business Media

Published: 2006-09-24

Total Pages: 685

ISBN-13: 3540356533

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This book presents model-based analysis and design methods for fault diagnosis and fault-tolerant control. Architectural and structural models are used to analyse the propagation of the fault through the process, test fault detectability and reveal redundancies that can be used to ensure fault tolerance. Case studies demonstrate the methods presented. The second edition includes new material on reconfigurable control, diagnosis of nonlinear systems, and remote diagnosis, plus new examples and updated bibliography.


Practical Digital Logic Design and Testing

Practical Digital Logic Design and Testing

Author: Parag K. Lala

Publisher:

Published: 1996

Total Pages: 440

ISBN-13:

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This text presents the essentials of modern logic design. The author conveys key concepts in a clear, informal manner, demonstrating theory through numerous examples to establish a theoretical basis for practical applications. All major topics, including PLD-based digital design, are covered, and detailed coverage of digital logic circuit testing methods critical to successful chip manufacturing, are included. The industry standard PLD programming language ABEL is fully integrated where appropriate. The work also includes coverage of test generation techniques and design methods for testability, a complete discussion of PLD (Programmable Logic Device) based digital design, and coverage of state assignment and minimization explained using computer aided techniques.


Fault-Tolerant Design and Control of Automated Vehicles and Processes

Fault-Tolerant Design and Control of Automated Vehicles and Processes

Author: Ralf Stetter

Publisher: Springer

Published: 2019-02-14

Total Pages: 217

ISBN-13: 3030128466

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This book summarizes strategies, methods, algorithms, frameworks and systems for the fault-tolerant design and control of automated vehicles and processes. Intelligent systems may be able to accommodate inevitable faults, but this ability requires targeted design processes and advanced control systems. This book explains the respective elements involved in automated vehicles and processes. It provides detailed descriptions of fault-tolerant design, not offered in the existent scientific literature. With regard to fault-tolerant control, the focus is on innovative methods, which can accommodate not only uncertainties, but also shared and flexible redundant elements. The book is intended to present a concise guide for researchers in the field of fault-tolerant design and control, and to provide concrete insights for design and control engineers working in the field of automated vehicles and processes.


Data-driven Design of Fault Diagnosis and Fault-tolerant Control Systems

Data-driven Design of Fault Diagnosis and Fault-tolerant Control Systems

Author: Steven X. Ding

Publisher: Springer Science & Business Media

Published: 2014-04-12

Total Pages: 306

ISBN-13: 1447164105

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Data-driven Design of Fault Diagnosis and Fault-tolerant Control Systems presents basic statistical process monitoring, fault diagnosis, and control methods and introduces advanced data-driven schemes for the design of fault diagnosis and fault-tolerant control systems catering to the needs of dynamic industrial processes. With ever increasing demands for reliability, availability and safety in technical processes and assets, process monitoring and fault-tolerance have become important issues surrounding the design of automatic control systems. This text shows the reader how, thanks to the rapid development of information technology, key techniques of data-driven and statistical process monitoring and control can now become widely used in industrial practice to address these issues. To allow for self-contained study and facilitate implementation in real applications, important mathematical and control theoretical knowledge and tools are included in this book. Major schemes are presented in algorithm form and demonstrated on industrial case systems. Data-driven Design of Fault Diagnosis and Fault-tolerant Control Systems will be of interest to process and control engineers, engineering students and researchers with a control engineering background.


System-on-Chip Test Architectures

System-on-Chip Test Architectures

Author: Laung-Terng Wang

Publisher: Morgan Kaufmann

Published: 2010-07-28

Total Pages: 893

ISBN-13: 0080556809

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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.