Electron Energy-Loss Spectroscopy in the Electron Microscope
Electron Energy-Loss Spectroscopy in the Electron Microscope

Author: R.F. Egerton

Publisher: Springer Science & Business Media

Published: 2013-03-09

Total Pages: 491

ISBN-13: 1475750994

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to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.

Electron Energy Loss Spectroscopy and Surface Vibrations
Electron Energy Loss Spectroscopy and Surface Vibrations

Author: H. Ibach

Publisher: Academic Press

Published: 2013-10-22

Total Pages: 379

ISBN-13: 1483259455

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Electron Energy Loss Spectroscopy and Surface Vibrations is devoted to electron energy loss spectroscopy as a probe of the crystal surface. Electrons with energy in the range of a few electron volts sample only a few atomic layers. As they approach or exit from the crystal, they interact with the vibrational modes of the crystal surface, or possibly with other elementary excitations localized there. The energy spectrum of electrons back-reflected from the surface is thus a rich source of information on its dynamics. The book opens with a detailed analysis of the physics that controls the operation of the monochromator, which is the core of the experimental apparatus. Separate chapters follow on the interaction of electrons with vibrational modes of the surface region and with other elementary excitations in the vicinity; the lattice dynamics of clean and adsorbate-covered surfaces, with emphasis on those features of particular relevance to surface vibrational spectroscopy; and selected applications vibration spectroscopy in surface physics and chemistry.

Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas
Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas

Author: Channing C. Ahn

Publisher: John Wiley & Sons

Published: 2006-03-06

Total Pages: 472

ISBN-13: 3527604774

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This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.

Electron Energy Loss Spectroscopy
Electron Energy Loss Spectroscopy

Author: R. Brydson

Publisher: Garland Science

Published: 2020-08-13

Total Pages: 245

ISBN-13: 1000144623

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Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.

Encyclopedia of Tribology
Encyclopedia of Tribology

Author: Q. Jane Wang

Publisher: Springer

Published: 2013-09-26

Total Pages: 4139

ISBN-13: 9780387928982

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TRIBOLOGY – the study of friction, wear and lubrication – impacts almost every aspect of our daily lives. The Springer Encyclopedia of Tribology is an authoritative and comprehensive reference covering all major aspects of the science and engineering of tribology that are relevant to researchers across all engineering industries and related scientific disciplines. This is the first major reference that brings together the science, engineering and technological aspects of tribology of this breadth and scope in a single work. Developed and written by leading experts in the field, the Springer Encyclopedia of Tribology covers the fundamentals as well as advanced applications across material types, different length and time scales, and encompassing various engineering applications and technologies. Exciting new areas such as nanotribology, tribochemistry and biotribology have also been included. As a six-volume set, the Springer Encyclopedia of Tribology comprises 1630 entries written by authoritative experts in each subject area, under the guidance of an international panel of key researchers from academia, national laboratories and industry. With alphabetically-arranged entries, concept diagrams and cross-linking features, this comprehensive work provides easy access to essential information for both researchers and practicing engineers in the fields of engineering (aerospace, automotive, biomedical, chemical, electrical, and mechanical) as well as materials science, physics, and chemistry.

Aberration-Corrected Analytical Transmission Electron Microscopy
Aberration-Corrected Analytical Transmission Electron Microscopy

Author: Rik Brydson

Publisher: John Wiley & Sons

Published: 2011-08-02

Total Pages: 235

ISBN-13: 1119979900

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The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Fundamentals of Inelastic Electron Scattering
Fundamentals of Inelastic Electron Scattering

Author: P. Schattschneider

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 205

ISBN-13: 3709188660

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Electron energy loss spectroscopy (ELS) is a vast subject with a long and honorable history. The problem of stopping power for high energy particles interested the earliest pioneers of quantum mechanics such as Bohr and Bethe, who laid the theoretical foun dations of the subject. The experimental origins might perhaps be traced to the original Franck-Hertz experiment. The modern field includes topics as diverse as low energy reflection electron energy loss studies of surface vibrational modes, the spectroscopy of gases and the modern theory of plasmon excitation in crystals. For the study of ELS in electron microscopy, several historically distinct areas of physics are relevant, including the theory of the Debye Waller factor for virtual inelastic scattering, the use of complex optical potentials, lattice dynamics for crystalline specimens and the theory of atomic ionisation for isolated atoms. However the field of electron energy loss spectroscopy contains few useful texts which can be recommended for students. With the recent appearance of Raether's and Egerton's hooks (see text for references), we have for the first time both a comprehensive review text-due to Raether-and a lucid introductory text which emphasizes experimental aspects-due to Egerton. Raether's text tends to emphasize the recent work on surface plasmons, while the strength of Egerton's book is its treatment of inner shell excitations for microanalysis, based on the use of atomic wavefunctions for crystal electrons.

Transmission Electron Microscopy
Transmission Electron Microscopy

Author: Ludwig Reimer

Publisher: Springer

Published: 2013-11-11

Total Pages: 532

ISBN-13: 3662135531

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The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.

Science of Microscopy
Science of Microscopy

Author: P.W. Hawkes

Publisher: Springer Science & Business Media

Published: 2008-08-29

Total Pages: 1336

ISBN-13: 0387497625

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This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.