International Conference on Indium Phosphide and Related Materials
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Published: 2000
Total Pages: 602
ISBN-13:
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Published: 2000
Total Pages: 602
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DOWNLOAD EBOOKAuthor: Trevar Riley
Publisher:
Published: 1991
Total Pages: 710
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DOWNLOAD EBOOKAuthor: Kalisadhan Mukherjee
Publisher: Springer Nature
Published: 2022-09-15
Total Pages: 536
ISBN-13: 9811925720
DOWNLOAD EBOOKThis book presents the select proceedings of the International Symposium entitled “Materials of the Millennium: Emerging Trends and Future Prospects” (MMETFP 2021). It discusses the synthesis, tailoring, and characterization of different materials for functional applications in various sectors which include but not limited to energy, environment, biomedical/ health care, construction, transportation etc. Topics covered in this book are synthesis and characterization of polymers, ceramics, composites, biomaterials, carbon-based nanostructures as well as materials for green environment, structural materials, modeling and simulation of materials. The book also covers the topic of emerging trends in nanostructured materials, thin films, and devices. The book is useful for students, researchers, and professionals working in the various areas of materials science and engineering.
Author: Rajendra Singh
Publisher:
Published: 1989
Total Pages: 672
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DOWNLOAD EBOOKAuthor: Osamu Ueda
Publisher: Springer Science & Business Media
Published: 2012-09-22
Total Pages: 618
ISBN-13: 1461443377
DOWNLOAD EBOOKMaterials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
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Published: 1995
Total Pages: 892
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Published: 1994
Total Pages: 454
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Publisher: Woodhead Publishing
Published: 2015-10-24
Total Pages: 551
ISBN-13: 1782424687
DOWNLOAD EBOOKPhotodetectors: Materials, Devices and Applications discusses the devices that convert light to electrical signals, key components in communication, computation, and imaging systems. In recent years, there has been significant improvement in photodetector performance, and this important book reviews some of the key advances in the field. Part one covers materials, detector types, and devices, and includes discussion of silicon photonics, detectors based on reduced dimensional charge systems, carbon nanotubes, graphene, nanowires, low-temperature grown gallium arsenide, plasmonic, Si photomultiplier tubes, and organic photodetectors, while part two focuses on important applications of photodetectors, including microwave photonics, communications, high-speed single photon detection, THz detection, resonant cavity enhanced photodetection, photo-capacitors and imaging. Reviews materials, detector types and devices Addresses fabrication techniques, and the advantages and limitations and different types of photodetector Considers a range of application for this important technology Includes discussions of silicon photonics, detectors based on reduced dimensional charge systems, carbon nanotubes, graphene, nanowires, and more
Author: N. Mohankumar
Publisher: CRC Press
Published: 2021-09-28
Total Pages: 114
ISBN-13: 1000454568
DOWNLOAD EBOOKHigh electron mobility transistor (HEMT) has better performance potential than the conventional MOSFETs. Further, InAs is a perfect candidate for the HEMT device architecture owing to its peak electron mobility. Advanced Indium Arsenide-based HEMT Architectures for Terahertz Applications characterizes the HEMT based on InAs III-V material to achieve outstanding current and frequency performance. This book explains different types of device architectures available to enhance performance including InAs-based single gate (SG) HEMT and double gate (DG) HEMT. The noise analysis of InAs-based SG and DG-HEMT is also discussed. The main goal of this book is to characterize the InAs device to achieve terahertz frequency regime with proper device parameters. Features: Explains the influence of InAs material in the performance of HEMTs and MOS-HEMTs. Covers novel indium arsenide architectures for achieving terahertz frequencies Discusses impact of device parameters on frequency response Illustrates noise characterization of optimized indium arsenide HEMTs Introduces terahertz electronics including sources for terahertz applications. This book is of special interest to researchers and graduate students in Electronics Engineering, High Electron Mobility Transistors, Semi-conductors, Communications, and Nanodevices.
Author: D. Nirmal
Publisher: CRC Press
Published: 2019-05-14
Total Pages: 434
ISBN-13: 0429862520
DOWNLOAD EBOOKThis book focusses on III-V high electron mobility transistors (HEMTs) including basic physics, material used, fabrications details, modeling, simulation, and other important aspects. It initiates by describing principle of operation, material systems and material technologies followed by description of the structure, I-V characteristics, modeling of DC and RF parameters of AlGaN/GaN HEMTs. The book also provides information about source/drain engineering, gate engineering and channel engineering techniques used to improve the DC-RF and breakdown performance of HEMTs. Finally, the book also highlights the importance of metal oxide semiconductor high electron mobility transistors (MOS-HEMT). Key Features Combines III-As/P/N HEMTs with reliability and current status in single volume Includes AC/DC modelling and (sub)millimeter wave devices with reliability analysis Covers all theoretical and experimental aspects of HEMTs Discusses AlGaN/GaN transistors Presents DC, RF and breakdown characteristics of HEMTs on various material systems using graphs and plots