2016 IEEE 25th Asian Test Symposium
2016 IEEE 25th Asian Test Symposium

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Publisher:

Published: 2016

Total Pages: 320

ISBN-13:

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Annotation The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.

ATS 2003
ATS 2003

Author:

Publisher: Institute of Electrical & Electronics Engineers(IEEE)

Published: 2003

Total Pages: 544

ISBN-13: 9780769519517

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The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. ATS 2003's papers shares state-of-the-art ideas and technologies in testing.

11th Asian Test Symposium (ATS'02)
11th Asian Test Symposium (ATS'02)

Author:

Publisher: IEEE Computer Society Press

Published: 2002

Total Pages: 464

ISBN-13:

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Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si