Ageing of Integrated Circuits

Ageing of Integrated Circuits

Author: Basel Halak

Publisher: Springer Nature

Published: 2019-09-30

Total Pages: 231

ISBN-13: 3030237818

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This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.


Counterfeit Integrated Circuits

Counterfeit Integrated Circuits

Author: Mark (Mohammad) Tehranipoor

Publisher: Springer

Published: 2015-02-12

Total Pages: 282

ISBN-13: 3319118242

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This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.


Thermal Testing of Integrated Circuits

Thermal Testing of Integrated Circuits

Author: J. Altet

Publisher: Springer Science & Business Media

Published: 2013-03-09

Total Pages: 212

ISBN-13: 1475736355

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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.


Reliability of High-Power Mechatronic Systems 1

Reliability of High-Power Mechatronic Systems 1

Author: Abdelkhalak El Hami

Publisher: Elsevier

Published: 2017-09-27

Total Pages: 314

ISBN-13: 0081024223

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This first volume of a set dedicated to the reliability of high-power mechatronic systems focuses specifically on simulation, modeling and optimization in automotive and aerospace applications. In the search to improve industrial competitiveness, the development of methods and tools for the design of products is especially pertinent in the context of cost reduction. This book seeks to propose new methods that simultaneously allow for a quicker design of future mechatronic devices in the automotive and aerospace industries while guaranteeing their increased reliability. The reliability of these critical elements is further validated digitally through new multi-physical and probabilistic models that could ultimately lead to new design standards and reliable forecasting. - Presents a methodological guide that demonstrates the reliability of fractured mechatronic components and devices - Includes numerical and statistical models to optimize the reliability of the product architecture - Helps users develop a methodology to characterize critical elements at the earliest stage


Ageing and Invisibility

Ageing and Invisibility

Author: Emilio Mordini

Publisher: IOS Press

Published: 2010

Total Pages: 240

ISBN-13: 1607506149

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Providing an overview of the process of e-inclusion for older people and addressing the ethical, social and legal aspects of the process, this book is suitable for researchers, policy-makers, organisations and companies, as well as for those with an interest in the identification and promotion of good practice within an ageing society.


Issues in Electronic Circuits, Devices, and Materials: 2013 Edition

Issues in Electronic Circuits, Devices, and Materials: 2013 Edition

Author:

Publisher: ScholarlyEditions

Published: 2013-05-01

Total Pages: 1169

ISBN-13: 1490109269

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Issues in Electronic Circuits, Devices, and Materials: 2013 Edition is a ScholarlyEditions™ book that delivers timely, authoritative, and comprehensive information about Microwave Research. The editors have built Issues in Electronic Circuits, Devices, and Materials: 2013 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Microwave Research in this book to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Electronic Circuits, Devices, and Materials: 2013 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.


Information and Communication Technologies for Ageing Well and e-Health

Information and Communication Technologies for Ageing Well and e-Health

Author: Carsten Röcker

Publisher: Springer

Published: 2018-06-13

Total Pages: 224

ISBN-13: 3319936441

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This book constitutes the thoroughly refereed proceedings of the third International Conference on Communication Technologies for Ageing Well and e-Health, ICT4AWE 2017, held in Porto, Portugal in April 2017. The 10 full papers presented were carefully reviewed and selected from 32 submissions. The papers aim at contributing to the understanding of relevant trends of current research on ICT for Ageing Well and eHealth including the collection and evaluation of day/night end user behavior patterns through the adoption of wearable technologies.


Languages, Design Methods, and Tools for Electronic System Design

Languages, Design Methods, and Tools for Electronic System Design

Author: Tom J. Kazmierski

Publisher: Springer Nature

Published: 2019-12-20

Total Pages: 197

ISBN-13: 3030315851

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This book brings together a selection of the best papers from the twenty-first edition of the Forum on specification and Design Languages Conference (FDL), which took place on September 10-12, 2018, in Munich, Germany. FDL is a well-established international forum devoted to dissemination of research results, practical experiences and new ideas in the application of specification, design and verification languages to the design, modeling and verification of integrated circuits, complex hardware/software embedded systems, and mixed-technology systems. Covers Assertion Based Design, Verification & Debug; Includes language-based modeling and design techniques for embedded systems; Covers design, modeling and verification of mixed physical domain and mixed signal systems that include significant analog parts in electrical and non-electrical domains; Includes formal and semi-formal system level design methods for complex embedded systems based on the Unified Modelling Language (UML) and Model Driven Engineering (MDE).


NB/T 20019-2010 Translated English of Chinese Standard. (NBT 20019-2010, NB/T20019-2010, NBT20019-2010)

NB/T 20019-2010 Translated English of Chinese Standard. (NBT 20019-2010, NB/T20019-2010, NBT20019-2010)

Author: https://www.chinesestandard.net

Publisher: https://www.chinesestandard.net

Published: 2020-03-21

Total Pages: 22

ISBN-13:

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This Standard specifies technical requirements for ageing, screening, and derating of electronic elements and devices in safety class instrument and control equipment of nuclear power plants. This Standard is applicable to ageing, screening, and derating of electronic elements and devices in safety class instrument and control equipment of nuclear power plants. It can be also used as reference for ageing, screening, and derating of electronic elements and devices in other safety class electrical equipment.


Stochastic Ageing and Dependence for Reliability

Stochastic Ageing and Dependence for Reliability

Author: Chin Diew Lai

Publisher: Springer Science & Business Media

Published: 2006-09-24

Total Pages: 437

ISBN-13: 038734232X

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This book provides a panoramic view of theory and applications of Ageing and Dependence in the use of mathematical methods in reliability and survival analysis. Ageing and dependence are important characteristics in reliability and survival analysis. They affect decisions with regard to maintenance, repair/replacement, price setting, warranties, medical studies, and other areas. Most of the works containing the topics covered here are theoretical in nature. However, this book offers applications, exercises, and examples. It serves as a reference for professors and researchers involved in reliability and survival analysis.