A Practical Guide to Surface Metrology
A Practical Guide to Surface Metrology

Author: Michael Quinten

Publisher: Springer Nature

Published: 2020-01-01

Total Pages: 247

ISBN-13: 3030294544

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This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context. Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors). The book provides: Overview of the working principles Description of advantages and disadvantages Currently achievable numbers for resolutions, repeatability, and reproducibility Examples of real-world applications A final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization of surfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.

A Practical Guide to Optical Metrology for Thin Films
A Practical Guide to Optical Metrology for Thin Films

Author: Michael Quinten

Publisher: John Wiley & Sons

Published: 2012-09-24

Total Pages: 212

ISBN-13: 3527664351

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A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon. Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.

Optical Measurement of Surface Topography
Optical Measurement of Surface Topography

Author: Richard Leach

Publisher: Springer Science & Business Media

Published: 2011-03-31

Total Pages: 333

ISBN-13: 3642120121

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The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

Industrial Metrology
Industrial Metrology

Author: Graham T. Smith

Publisher: Springer Science & Business Media

Published: 2013-04-17

Total Pages: 336

ISBN-13: 1447138147

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The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. It has taken a long time for manufacturing engineers and designers to realise the usefulness of these features in quality of conformance and quality of design. Unfortunately this awareness has come at a time when engineers versed in the use and specification of surfaces are at a premium. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications. Such people understood the processes and the achievable accuracies of machine tools, thereby enabling them to match production capability with design requirements. This synergy, has been made possible by the understanding of adherence to careful metrological procedures and a detailed knowledge of surface measuring instruments and their operation, in addition to wider inspection room techniques. With the demise in the UK of polytechnics and technical colleges, this source of skilled technicians has all but dried up. The shortfall has been made up of semi skilled craftsmen, or inexperienced graduates who cannot be expected to satisfy tradition al or new technology needs. Miniaturisation, for example, has had a pro found effect. Engineering parts are now routinely being made with nanometre surface texture and fiatness. At these molecular and atomic scales, the engineer has to be a physicist.

Fused Deposition Modeling Based 3D Printing
Fused Deposition Modeling Based 3D Printing

Author: Harshit K. Dave

Publisher: Springer Nature

Published: 2021-04-21

Total Pages: 517

ISBN-13: 303068024X

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This book covers 3D printing activities by fused deposition modeling process. The two introductory chapters discuss the principle, types of machines and raw materials, process parameters, defects, design variations and simulation methods. Six chapters are devoted to experimental work related to process improvement, mechanical testing and characterization of the process, followed by three chapters on post-processing of 3D printed components and two chapters addressing sustainability concerns. Seven chapters discuss various applications including composites, external medical devices, drug delivery system, orthotic inserts, watertight components and 4D printing using FDM process. Finally, six chapters are dedicated to the study on modeling and optimization of FDM process using computational models, evolutionary algorithms, machine learning, metaheuristic approaches and optimization of layout and tool path.

Handbook of Optical Metrology
Handbook of Optical Metrology

Author: Toru Yoshizawa

Publisher: CRC Press

Published: 2017-07-28

Total Pages: 866

ISBN-13: 1351831844

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Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

A Practical Guide to Optical Microscopy
A Practical Guide to Optical Microscopy

Author: John Girkin

Publisher: CRC Press

Published: 2019-06-14

Total Pages: 260

ISBN-13: 1351630369

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Choice Recommended Title, March 2020 Optical microscopy is used in a vast range of applications ranging from materials engineering to in vivo observations and clinical diagnosis, and thanks to the latest advances in technology, there has been a rapid growth in the number of methods available. This book is aimed at providing users with a practical guide to help them select, and then use, the most suitable method for their application. It explores the principles behind the different forms of optical microscopy, without the use of complex maths, to provide an understanding to help the reader utilise a specific method and then interpret the results. Detailed physics is provided in boxed sections, which can be bypassed by the non-specialist. It is an invaluable tool for use within research groups and laboratories in the life and physical sciences, acting as a first source for practical information to guide less experienced users (or those new to a particular methodology) on the range of techniques available. Features: The first book to cover all current optical microscopy methods for practical applications Written to be understood by a non-optical expert with inserts to provide the physical science background Brings together conventional widefield and confocal microscopy, with advanced non-linear and super resolution methods, in one book To learn more about the author please visit here.

Metrology and Properties of Engineering Surfaces
Metrology and Properties of Engineering Surfaces

Author: E. Mainsah

Publisher: Springer Science & Business Media

Published: 2013-03-14

Total Pages: 470

ISBN-13: 1475733690

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Metrology and Properties of Engineering Surfaces provides in a single volume a comprehensive and authoritative treatment of the crucial topics involved in the metrology and properties of engineering surfaces. The subject matter is a central issue in manufacturing technology, since the quality and reliability of manufactured components depend greatly upon the selection and qualities of the appropriate materials as ascertained through measurement. The book can in broad terms be split into two parts; the first deals with the metrology of engineering surfaces and covers the important issues relating to the measurement and characterization of surfaces in both two and three dimensions. This covers topics such as filtering, power spectral densities, autocorrelation functions and the use of Fractals in topography. A significant proportion is dedicated to the calibration of scanning probe microscopes using the latest techniques. The remainder of the book deals with the properties of engineering surfaces and covers a wide range of topics including hardness (measurement and relevance), surface damage and the machining of brittle surfaces, the characterization of automobile cylinder bores using different techniques including artificial neural networks and the design and use of polymer bearings in microelectromechanical devices. Edited by three practitioners with a wide knowledge of the subject and the community, Metrology and Properties of Engineering Surfaces brings together leading academics and practitioners in a comprehensive and insightful treatment of the subject. The book is an essential reference work both for researchers working and teaching in the technology and for industrial users who need to be aware of current developments of the technology and new areas of application.