X-Ray Absorption and X-Ray Emission Spectroscopy, 2 Volume Set
X-Ray Absorption and X-Ray Emission Spectroscopy, 2 Volume Set

Author: Jeroen A. van Bokhoven

Publisher: John Wiley & Sons

Published: 2016-03-21

Total Pages: 940

ISBN-13: 1118844238

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X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x-ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x-ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X-ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X-ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials

X-Ray Absorption Spectroscopy of Semiconductors
X-Ray Absorption Spectroscopy of Semiconductors

Author: Claudia S. Schnohr

Publisher: Springer

Published: 2014-11-05

Total Pages: 367

ISBN-13: 3662443627

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X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

X-Ray Scattering from Semiconductors and Other Materials
X-Ray Scattering from Semiconductors and Other Materials

Author: Paul F. Fewster

Publisher: World Scientific

Published: 2015

Total Pages: 510

ISBN-13: 9814436933

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This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included. This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.

Characterization of Semiconductor Heterostructures and Nanostructures
Characterization of Semiconductor Heterostructures and Nanostructures

Author: Giovanni Agostini

Publisher: Elsevier

Published: 2011-08-11

Total Pages: 501

ISBN-13: 0080558151

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In the last couple of decades, high-performance electronic and optoelectronic devices based on semiconductor heterostructures have been required to obtain increasingly strict and well-defined performances, needing a detailed control, at the atomic level, of the structural composition of the buried interfaces. This goal has been achieved by an improvement of the epitaxial growth techniques and by the parallel use of increasingly sophisticated characterization techniques and of refined theoretical models based on ab initio approaches. This book deals with description of both characterization techniques and theoretical models needed to understand and predict the structural and electronic properties of semiconductor heterostructures and nanostructures. - Comprehensive collection of the most powerful characterization techniques for semiconductor heterostructures and nanostructures - Most of the chapters are authored by scientists that are among the top 10 worldwide in publication ranking of the specific field - Each chapter starts with a didactic introduction on the technique - The second part of each chapter deals with a selection of top examples highlighting the power of the specific technique to analyze the properties of semiconductors

Handbook of Materials Characterization
Handbook of Materials Characterization

Author: Surender Kumar Sharma

Publisher: Springer

Published: 2018-09-18

Total Pages: 612

ISBN-13: 3319929550

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This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

Semiconductor X-Ray Detectors
Semiconductor X-Ray Detectors

Author: B. G. Lowe

Publisher: CRC Press

Published: 2013-12-07

Total Pages: 610

ISBN-13: 1466554010

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This book focuses on the history and development of Si(Li) X-Ray Detectors, while providing an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters summarize relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the manufacture and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.

NEXAFS Spectroscopy
NEXAFS Spectroscopy

Author: Joachim Stöhr

Publisher: Springer Science & Business Media

Published: 2013-04-17

Total Pages: 415

ISBN-13: 3662028530

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This is the first ever comprehensive treatment of NEXAFS spectroscopy. It is suitable for novice researchers as an introduction to the field, while experts will welcome the detailed description of state-of-the-art instrumentation and analysis techniques, along with the latest experimental and theoretical results.

Semiconductor Research
Semiconductor Research

Author: Amalia Patane

Publisher: Springer Science & Business Media

Published: 2012-04-12

Total Pages: 384

ISBN-13: 3642233511

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The book describes the fundamentals, latest developments and use of key experimental techniques for semiconductor research. It explains the application potential of various analytical methods and discusses the opportunities to apply particular analytical techniques to study novel semiconductor compounds, such as dilute nitride alloys. The emphasis is on the technique rather than on the particular system studied.

Photocatalytic Hydrogen Evolution
Photocatalytic Hydrogen Evolution

Author: Misook Kang

Publisher: MDPI

Published: 2020-06-17

Total Pages: 136

ISBN-13: 3039363107

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Energy crises and global warming pose serious challenges to researchers in their attempt to develop a sustainable society for the future. Solar energy conversion is a remarkable, clean, and sustainable way to nullify the effects of fossil fuels. The findings of photocatalytic hydrogen production (PCHP) by Fujishima and Honda propose that “water will be the coal for the future”. Hydrogen is a carbon-free clean fuel with a high specific energy of combustion. Titanium oxide (TiO2), graphitic-carbon nitride (g-C3N4) and cadmium sulfide (CdS) are three pillars of water splitting photocatalysts owing to their superior electronic and optical properties. Tremendous research efforts have been made in recent years to fabricate visible or solar-light, active photocatalysts. The significant features of various oxide, sulfide, and carbon based photocatalysts for cost-effective hydrogen production are presented in this Special Issue. The insights of sacrificial agents on the hydrogen production efficiency of catalysts are also presented in this issue.