Interconnection Network Reliability Evaluation
Interconnection Network Reliability Evaluation

Author: Neeraj Kumar Goyal

Publisher: John Wiley & Sons

Published: 2020-10-06

Total Pages: 240

ISBN-13: 1119620589

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This book presents novel and efficient tools, techniques and approaches for reliability evaluation, reliability analysis, and design of reliable communication networks using graph theoretic concepts. In recent years, human beings have become largely dependent on communication networks, such as computer communication networks, telecommunication networks, mobile switching networks etc., for their day-to-day activities. In today's world, humans and critical machines depend on these communication networks to work properly. Failure of these communication networks can result in situations where people may find themselves isolated, helpless and exposed to hazards. It is a fact that every component or system can fail and its failure probability increases with size and complexity. The main objective of this book is to devize approaches for reliability modeling and evaluation of such complex networks. Such evaluation helps to understand which network can give us better reliability by their design. New designs of fault-tolerant interconnection network layouts are proposed, which are capable of providing high reliability through path redundancy and fault tolerance through reduction of common elements in paths. This book covers the reliability evaluation of various network topologies considering multiple reliability performance parameters (two terminal reliability, broadcast reliability, all terminal reliability, and multiple sources to multiple destinations reliability).

Network Reliability
Network Reliability

Author: Sanjay Kumar Chaturvedi

Publisher: John Wiley & Sons

Published: 2016-07-12

Total Pages: 226

ISBN-13: 1119224039

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In Engineering theory and applications, we think and operate in terms of logics and models with some acceptable and reasonable assumptions. The present text is aimed at providing modelling and analysis techniques for the evaluation of reliability measures (2-terminal, all-terminal, k-terminal reliability) for systems whose structure can be described in the form of a probabilistic graph. Among the several approaches of network reliability evaluation, the multiple-variable-inversion sum-of-disjoint product approach finds a well-deserved niche as it provides the reliability or unreliability expression in a most efficient and compact manner. However, it does require an efficiently enumerated minimal inputs (minimal path, spanning tree, minimal k-trees, minimal cut, minimal global-cut, minimal k-cut) depending on the desired reliability. The present book covers these two aspects in detail through the descriptions of several algorithms devised by the "reliability fraternity" and explained through solved examples to obtain and evaluate 2-terminal, k-terminal and all-terminal network reliability/unreliability measures and could be its USP. The accompanying web-based supplementary information containing modifiable Matlab® source code for the algorithms is another feature of this book. A very concerted effort has been made to keep the book ideally suitable for first course or even for a novice stepping into the area of network reliability. The mathematical treatment is kept as minimal as possible with an assumption on the readers’ side that they have basic knowledge in graph theory, probabilities laws, Boolean laws and set theory.

Masters Theses in the Pure and Applied Sciences
Masters Theses in the Pure and Applied Sciences

Author: Wade H. Shafer

Publisher: Springer Science & Business Media

Published: 2013-11-21

Total Pages: 307

ISBN-13: 1475757794

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Masters Theses in the Pure and Applied Sciences was first conceived, published, and dis· seminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) *at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the ac· tivity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all concerned if the printing and distribution of the volume were handled by an international publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Corporation of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 20 (thesis year 1975) a total of 10,374 theses titles from 28 Canadian and 239 United States universities. We are sure that this broader base for theses titles reported will greatly enhance the value of this important annual reference work. The organization of Volume 20 is identical to that of past years. It consists of theses titles arranged by discipline and by university within each discipline.