Thirty-fourth International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International
Published: 2008-01-01
Total Pages: 551
ISBN-13: 1615030913
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Thirty-fourth International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International(OH)
Published: 2008-01-01
Total Pages: 528
ISBN-13: 9780871707147
DOWNLOAD EBOOKISTFA 2014
Author: A. S. M. International
Publisher: ASM International
Published: 2014-11-01
Total Pages: 561
ISBN-13: 1627080740
DOWNLOAD EBOOKThis volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International
Published: 2007-01-01
Total Pages: 372
ISBN-13: 1615030905
DOWNLOAD EBOOKPrintbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2007
Author: ASM International
Publisher: ASM International(OH)
Published: 2007
Total Pages: 356
ISBN-13: 9780871708632
DOWNLOAD EBOOKPrintbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
Istfa 2003
Author: ASM International
Publisher: ASM International
Published: 2003-01-01
Total Pages: 534
ISBN-13: 1615030867
DOWNLOAD EBOOKISTFA 2005
Author: ASM International
Publisher: ASM International(OH)
Published: 2005
Total Pages: 523
ISBN-13: 9780871708236
DOWNLOAD EBOOKISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher:
Published: 2017-12
Total Pages: 660
ISBN-13: 9781627081504
DOWNLOAD EBOOKThe theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
ISTFA 2009
Author:
Publisher: ASM International
Published: 2009-01-01
Total Pages: 371
ISBN-13: 1615030921
DOWNLOAD EBOOKThis volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
