Thermal Management of Microelectronic Equipment

Thermal Management of Microelectronic Equipment

Author: Lian-Tuu Yeh

Publisher: American Society of Mechanical Engineers

Published: 2002

Total Pages: 454

ISBN-13:

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With an increased demand on system reliability and performance combined with the miniaturization of devices, thermal consideration has become a crucial factor in the design of electronic packaging, from chip to system levels. This new book emphasizes the solving of practical design problems in a wide range of subjects related to various heat transfer technologies. While focusing on understanding the physics involved in the subject area, the authors have provided substantial practical design data and empirical correlations used in the analysis and design of equipment. The book provides the fundamentals along with a step-by-step analysis approach to engineering, making it an indispensable reference volume. The authors present a comprehensive convective heat transfer catalog that includes correlations of heat transfer for various physical configurations and thermal boundary conditions. They also provide property tables of solids and fluids. Lian-Tuu Yeh and Richard Chu are recognized experts in the field of thermal management of electronic systems and have a combined 60 years of experience in the defense and commercial industries.


Thermal Management Handbook: For Electronic Assemblies

Thermal Management Handbook: For Electronic Assemblies

Author: Jerry E. Sergent

Publisher: McGraw Hill Professional

Published: 1998

Total Pages: 370

ISBN-13: 9780070266995

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Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product. The "hands-on" guide to thermal management! In recent years, heat-sensitive electronic systems have been miniaturized far more than their heat-producing power supplies, leading to major design and reliability challenges — and making thermal management a critical design factor. This timely handbook covers all the practical issues that any packaging engineer must consider with regard to the thermal management of printed circuit boards, hybrid circuits, and multichip modules. Readers will also benefit from the extensive data on material properties and circuit functions, thus enabling more intelligent decisions at the design stage — and preventing thermal-related problems from occurring in the first place.


Influence of Temperature on Microelectronics and System Reliability

Influence of Temperature on Microelectronics and System Reliability

Author: Pradeep Lall

Publisher: CRC Press

Published: 2020-07-09

Total Pages: 332

ISBN-13: 0429605595

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This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to consist of a semiconductor device with first-level interconnects that may be wirebonds, flip-chip, or tape automated bonds; die attach; substrate; substrate attach; case; lid; lid seal; and lead seal. The temperature effects on electrical parameters of both bipolar and MOSFET devices are discussed, and models quantifying the temperature effects on package elements are identified. Temperature-related models have been used to derive derating criteria for determining the maximum and minimum allowable temperature stresses for a given microelectronic package architecture. The first chapter outlines problems with some of the current modeling strategies. The next two chapters present microelectronic device failure mechanisms in terms of their dependence on steady state temperature, temperature cycle, temperature gradient, and rate of change of temperature at the chip and package level. Physics-of-failure based models used to characterize these failure mechanisms are identified and the variabilities in temperature dependence of each of the failure mechanisms are characterized. Chapters 4 and 5 describe the effects of temperature on the performance characteristics of MOS and bipolar devices. Chapter 6 discusses using high-temperature stress screens, including burn-in, for high-reliability applications. The burn-in conditions used by some manufacturers are examined and a physics-of-failure approach is described. The


Thermal Management for Opto-electronics Packaging and Applications

Thermal Management for Opto-electronics Packaging and Applications

Author: Xiaobing Luo

Publisher: John Wiley & Sons

Published: 2024-08-12

Total Pages: 373

ISBN-13: 1119179270

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Thermal Management for Opto-electronics Packaging and Applications A systematic guide to the theory, applications, and design of thermal management for LED packaging In Thermal Management for Opto-electronics Packaging and Applications, a team of distinguished engineers and researchers deliver an authoritative discussion of the fundamental theory and practical design required for LED product development. Readers will get a solid grounding in thermal management strategies and find up-to-date coverage of heat transfer fundamentals, thermal modeling, and thermal simulation and design. The authors explain cooling technologies and testing techniques that will help the reader evaluate device performance and accelerate the design and manufacturing cycle. In this all-inclusive guide to LED package thermal management, the book provides the latest advances in thermal engineering design and opto-electronic devices and systems. The book also includes: A thorough introduction to thermal conduction and solutions, including discussions of thermal resistance and high thermal conductivity materials Comprehensive explorations of thermal radiation and solutions, including angular- and spectra-regulation radiative cooling Practical discussions of thermally enhanced thermal interfacial materials (TIMs) Complete treatments of hybrid thermal management in downhole devices Perfect for engineers, researchers, and industry professionals in the fields of LED packaging and heat transfer, Thermal Management for Opto-electronics Packaging and Applications will also benefit advanced students focusing on the design of LED product design.


Thermal Management of Microelectronic Equipment, Second Edition

Thermal Management of Microelectronic Equipment, Second Edition

Author: Lian-Tuu Yeh

Publisher:

Published: 2016

Total Pages:

ISBN-13:

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This Second Edition of a classic text is fully updated and greatly expanded, with in-depth revisions that include advancements in the component technology of microelectronics. The most noticeable one is the addition of an entirely new chapter on microwave modules and the gallium arsenide (GaAs) chips, which have seldom been discussed in any of the textbooks or publications in the area of thermal management of electronic equipment. With this new chapter, the book is complete and whole in the area of thermal design of electronics systems. With an increased demand on system reliability and performance combined with the miniaturization of devices, thermal consideration has become a crucial factor in the design of electronic packaging, from chip to system levels. This book emphasizes the solving of practical design problems in a wide range of subjects related to various heat transfer technologies. While focusing on understanding the physics involved in the subject area, the authors have provided substantial practical design data and empirical correlations used in the analysis and design of equipment. The book provides the fundamentals along with a step-by-step analysis approach to engineering, making it an indispensable reference volume.


Thermal Management of 3-D Stacked Chips Using Thermoelectric and Microfluidic Devices

Thermal Management of 3-D Stacked Chips Using Thermoelectric and Microfluidic Devices

Author: Matthew J. Redmond

Publisher:

Published: 2013

Total Pages:

ISBN-13:

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This thesis employs computational and experimental methods to explore hotspot cooling and high heat flux removal from a 3-D stacked chip using thermoelectric and microfluidic devices. Stacked chips are expected to improve microelectronics performance, but present severe thermal management challenges. The thesis provides an assessment of both thermoelectric and microfluidic technologies and provides guidance for their implementation in the 3-D stacked chips. A detailed 3-D thermal model of a stacked electronic package with two dies and four ultrathin integrated TECs is developed to investigate the efficacy of TECs in hotspot cooling for 3-D technology. The numerical analysis suggests that TECs can be used for on demand cooling of hotspots in 3-D stacked chip architecture. A strong vertical coupling is observed between the top and bottom TECs and it is found that the bottom TECs can detrimentally heat the top hotspots. As a result, TECs need to be carefully placed inside the package to avoid such undesired heating. Thermal contact resistances between dies, inside the TEC module, and between the TEC and heat spreader are shown to significantly affect TEC performance. TECs are most effective for cooling localized hotspots, but microchannels are advantageous for cooling large background heat fluxes. In the present work, the results of heat transfer and pressure drop experiments in the microchannels with water as the working fluid are presented and compared to the previous microchannel experiments and CFD simulations. Heat removal rates of greater than 100 W/cm2 are demonstrated with these microchannels, with a pressure drop of 75 kPa or less. A novel empirical correlation modeling method is proposed, which uses finite element modeling to model conduction in the channel walls and substrate, coupled with an empirical correlation to determine the convection coefficient. This empirical correlation modeling method is compared to resistor network and CFD modeling. The proposed modeling method produced more accurate results than resistor network modeling, while solving 60% faster than a conjugate heat transfer model using CFD. The results of this work demonstrate that microchannels have the ability to remove high heat fluxes from microelectronic packages using water as a working fluid. Additionally, TECs can locally cool hotspots, but must be carefully placed to avoid undesired heating. Future work should focus on overcoming practical challenges including fabrication, cost, and reliability which are preventing these technologies from being fully leveraged.


The Printed Circuit Designer's Guide To... Thermal Management with Insulated Metal Substrates, Vol. 2

The Printed Circuit Designer's Guide To... Thermal Management with Insulated Metal Substrates, Vol. 2

Author: Ventec International Group

Publisher:

Published: 2022-07-25

Total Pages: 0

ISBN-13:

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This book is meant to be a companion to The Printed Circuit Designer's Guide to Thermal Management with Insulated Metal Substrates, which describes material selection for cost-effective solutions and reliable designs. This second volume covers the latest developments in the field of thermal management, particularly in insulated metal substrates, using state-of-the-art products as examples and focusing on specific solutions and enhanced properties of IMS. These include not only the heat dissipation and the drive to increase thermal conductivity (W/mK), but the total thermal balance as well.Among the most pertinent questions is how to improve reliability of components as they become smaller and smaller, while being more efficient.Readers will also learn the value of understanding the various methods that have been applied to the modeling and testing of thermal materials. Different approaches give varying values of thermal conductivity when applied to the same material, and the effects of measurement errors and tolerance in dielectric thickness can also vary.