X-ray Standing Wave Technique, The: Principles And Applications
X-ray Standing Wave Technique, The: Principles And Applications

Author: Jorg Zegenhagen

Publisher: World Scientific

Published: 2013-01-30

Total Pages: 557

ISBN-13: 9814513105

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The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge in quite different fields of physics and technology. This volume presents comprehensively the theoretical background, technical requirements and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik and D Phil Woodruff, the book equips scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications.

The X-ray Standing Wave Technique
The X-ray Standing Wave Technique

Author:

Publisher:

Published: 2013

Total Pages: 534

ISBN-13: 9789812279002

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The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge in quite different fields of physics and technology. This volume presents comprehensively the theoretical background, technical requirements and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik and D Phil Woodruff, the book equips scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications.

X-Ray Diffraction
X-Ray Diffraction

Author: Oliver H. Seeck

Publisher: CRC Press

Published: 2015-02-10

Total Pages: 438

ISBN-13: 9814303607

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High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

X-Ray and Neutron Dynamical Diffraction
X-Ray and Neutron Dynamical Diffraction

Author: André Authier

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 419

ISBN-13: 1461558794

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This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

Soft X-ray Optics
Soft X-ray Optics

Author: Eberhard Spiller

Publisher: SPIE Press

Published: 1994

Total Pages: 296

ISBN-13: 9780819416544

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This text describes optics mainly in the 10 to 500 angstrom wavelength region. These wavelengths are 50 to 100 times shorter than those for visible light and 50 to 100 times longer than the wavelengths of medical x rays or x-ray diffraction from natural crystals. There have been substantial advances during the last 20 years, which one can see as an extension of optical technology to shorter wavelengths or as an extension of x-ray diffraction to longer wavelengths. Artificial diffracting structures like zone plates and multilayer mirrors are replacing the natural crystals of x-ray diffraction. Some of these structures can now be fabricated to have diffraction-limited resolution. The new possibilities are described in a simple, tutorial way.

Advances in Chemical Physics, Volume 77
Advances in Chemical Physics, Volume 77

Author: Ilya Prigogine

Publisher: John Wiley & Sons

Published: 2009-09-08

Total Pages: 665

ISBN-13: 0470141875

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The Advances in Chemical Physics series provides the chemical physics and physical chemistry fields with a forum for critical, authoritative evaluations of advances in every area of the discipline. Filled with cutting-edge research reported in a cohesive manner not found elsewhere in the literature, each volume of the Advances in Chemical Physics series serves as the perfect supplement to any advanced graduate class devoted to the study of chemical physics.

Physical Metallurgy
Physical Metallurgy

Author: David E. Laughlin

Publisher: Newnes

Published: 2014-07-24

Total Pages: 2963

ISBN-13: 0444537716

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This fifth edition of the highly regarded family of titles that first published in 1965 is now a three-volume set and over 3,000 pages. All chapters have been revised and expanded, either by the fourth edition authors alone or jointly with new co-authors. Chapters have been added on the physical metallurgy of light alloys, the physical metallurgy of titanium alloys, atom probe field ion microscopy, computational metallurgy, and orientational imaging microscopy. The books incorporate the latest experimental research results and theoretical insights. Several thousand citations to the research and review literature are included. - Exhaustively synthesizes the pertinent, contemporary developments within physical metallurgy so scientists have authoritative information at their fingertips - Replaces existing articles and monographs with a single, complete solution - Enables metallurgists to predict changes and create novel alloys and processes

Surface Science Techniques
Surface Science Techniques

Author: Gianangelo Bracco

Publisher: Springer Science & Business Media

Published: 2013-01-11

Total Pages: 668

ISBN-13: 3642342434

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The book describes the experimental techniques employed to study surfaces and interfaces. The emphasis is on the experimental method. Therefore all chapters start with an introduction of the scientific problem, the theory necessary to understand how the technique works and how to understand the results. Descriptions of real experimental setups, experimental results at different systems are given to show both the strength and the limits of the technique. In a final part the new developments and possible extensions of the techniques are presented. The included techniques provide microscopic as well as macroscopic information. They cover most of the techniques used in surface science.