The Physics and Chemistry of SiO2 and the Si-SiO2 Interface--4, 2000
Author: Hisham Z. Massoud
Publisher:
Published: 2000
Total Pages: 562
ISBN-13:
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Author: Hisham Z. Massoud
Publisher:
Published: 2000
Total Pages: 562
ISBN-13:
DOWNLOAD EBOOKAuthor: B. E. Deal
Publisher:
Published: 2014-01-15
Total Pages: 572
ISBN-13: 9781489907752
DOWNLOAD EBOOKAuthor: B. E. Deal
Publisher:
Published: 2014-09-01
Total Pages: 520
ISBN-13: 9781489915894
DOWNLOAD EBOOKAuthor: Hisham Z. Massoud
Publisher:
Published: 1996
Total Pages: 804
ISBN-13:
DOWNLOAD EBOOKAuthor: Sokrates T. Pantelides
Publisher: Elsevier
Published: 2013-09-17
Total Pages: 501
ISBN-13: 148313900X
DOWNLOAD EBOOKThe Physics of SiO2 and Its Interfaces covers the proceedings of the International Topical Conference on the Physics of SiO2 and its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York on March 22-24, 1978. The book focuses on the properties, reactions, transformations, and structures of silicon dioxide (SiO2). The selection first discusses the electronic properties of vitreous SiO2 and small polaron formation and motion of holes in a-SiO2. Discussions focus on mobility edges and polarons, deep states in the gap, and excitons. The text also ponders on field-dependent hole and exciton transport in SiO2 and electron emission from SiO2 into vacuum. The publication takes a look at the electronic structures of crystalline and amorphous SiO2; band structures and electronic properties of SiO2; and optical absorption spectrum of SiO2. The text also tackles chemical bond and related properties of SiO2; topological effects on the band structure of silica; and properties of localized SiO2 clusters in layers of disordered silicon on silver. The selection is a good reference for physicists and readers interested in the physics of silicon dioxide.
Author: Hisham Z. Massoud
Publisher: ECS Transactions
Published: 2005-01-01
Total Pages: 304
ISBN-13: 9781566774307
DOWNLOAD EBOOKThis issue of ECS Transactions places a focus on ultrathin gate dielectrics: novel technologies, characterization methods, process modeling, fundamental limits, and projections for scaling the gate oxide thickness.
Author:
Publisher:
Published: 2001
Total Pages: 306
ISBN-13:
DOWNLOAD EBOOKAuthor: Electrochemical Society. Dielectric Science and Technology Division
Publisher: The Electrochemical Society
Published: 2001
Total Pages: 304
ISBN-13: 9781566773133
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 19??
Total Pages:
ISBN-13:
DOWNLOAD EBOOKAuthor: Dim-Lee Kwong
Publisher: The Electrochemical Society
Published: 2001
Total Pages: 458
ISBN-13: 9781566773157
DOWNLOAD EBOOK"Electronics, Dielectric Science and Technology, and High Temperature Materials Divisions."