Testability Concepts for Digital ICs
Testability Concepts for Digital ICs

Author: F.P.M. Beenker

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 216

ISBN-13: 1461523656

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Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Test and Design-for-Testability in Mixed-Signal Integrated Circuits

Author: Jose Luis Huertas Díaz

Publisher: Springer Science & Business Media

Published: 2010-02-23

Total Pages: 310

ISBN-13: 0387235213

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Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Author: M. Bushnell

Publisher: Springer Science & Business Media

Published: 2006-04-11

Total Pages: 690

ISBN-13: 0306470403

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Digital Systems Testing and Testable Design
Digital Systems Testing and Testable Design

Author: Miron Abramovici

Publisher: Wiley-IEEE Press

Published: 1994-09-27

Total Pages: 672

ISBN-13: 9780780310629

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This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Principles of Testing Electronic Systems
Principles of Testing Electronic Systems

Author: Samiha Mourad

Publisher: John Wiley & Sons

Published: 2000-07-25

Total Pages: 444

ISBN-13: 9780471319313

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A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits

Author: Manoj Sachdev

Publisher: Springer Science & Business Media

Published: 2013-06-29

Total Pages: 317

ISBN-13: 1475749260

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Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Author: Krishnendu Chakrabarty

Publisher: Springer Science & Business Media

Published: 2013-04-17

Total Pages: 202

ISBN-13: 1475765274

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System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Digital System Test and Testable Design
Digital System Test and Testable Design

Author: Zainalabedin Navabi

Publisher: Springer Science & Business Media

Published: 2010-12-10

Total Pages: 452

ISBN-13: 1441975489

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This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

The Computer Engineering Handbook
The Computer Engineering Handbook

Author: Vojin G. Oklobdzija

Publisher: CRC Press

Published: 2001-12-26

Total Pages: 1422

ISBN-13: 9780849308857

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There is arguably no field in greater need of a comprehensive handbook than computer engineering. The unparalleled rate of technological advancement, the explosion of computer applications, and the now-in-progress migration to a wireless world have made it difficult for engineers to keep up with all the developments in specialties outside their own. References published only a few years ago are now sorely out of date. The Computer Engineering Handbook changes all of that. Under the leadership of Vojin Oklobdzija and a stellar editorial board, some of the industry's foremost experts have joined forces to create what promises to be the definitive resource for computer design and engineering. Instead of focusing on basic, introductory material, it forms a comprehensive, state-of-the-art review of the field's most recent achievements, outstanding issues, and future directions. The world of computer engineering is vast and evolving so rapidly that what is cutting-edge today may be obsolete in a few months. While exploring the new developments, trends, and future directions of the field, The Computer Engineering Handbook captures what is fundamental and of lasting value.

Analog Circuit Design
Analog Circuit Design

Author: Johan Huijsing

Publisher: Springer Science & Business Media

Published: 2013-03-14

Total Pages: 422

ISBN-13: 1475724624

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Johan H. Huijsing This book contains 18 tutorial papers concentrated on 3 topics, each topic being covered by 6 papers. The topics are: Low-Noise, Low-Power, Low-Voltage Mixed-Mode Design with CAD Tools Voltage, Current, and Time References The papers of this book were written by top experts in the field, currently working at leading European and American universities and companies. These papers are the reviewed versions of the papers presented at the Workshop on Advances in Analog Circuit Design. which was held in Villach, Austria, 26-28 April 1995. The chairman of the Workshop was Dr. Franz Dielacher from Siemens, Austria. The program committee existed of Johan H. Huijsing from the Delft University of Technology, Prof.Willy Sansen from the Catholic University of Leuven, and Dr. Rudy 1. van der Plassche from Philips Eindhoven. This book is the fourth of aseries dedicated to the design of analog circuits. The topics which were covered earlier were: Operational Amplifiers Analog to Digital Converters Analog Computer Aided Design Mixed AlD Circuit Design Sensor Interface Circuits Communication Circuits Low-Power, Low-Voltage Integrated Filters Smart Power As the Workshop will be continued year by year, a valuable series of topics will be built up from all the important areas of analog circuit design. I hope that this book will help designers of analog circuits to improve their work and to speed it up.