11th Asian Test Symposium (ATS'02)
11th Asian Test Symposium (ATS'02)

Author:

Publisher: IEEE Computer Society Press

Published: 2002

Total Pages: 464

ISBN-13:

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Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si

Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices

Author: Patrick Girard

Publisher: Springer Science & Business Media

Published: 2010-03-11

Total Pages: 376

ISBN-13: 1441909281

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Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Defect and Fault Tolerance in VLSI Systems
Defect and Fault Tolerance in VLSI Systems

Author: Robert Aitken

Publisher:

Published: 2004

Total Pages: 524

ISBN-13: 9780769522418

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DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.

ATS 2003
ATS 2003

Author:

Publisher: Institute of Electrical & Electronics Engineers(IEEE)

Published: 2003

Total Pages: 544

ISBN-13: 9780769519517

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The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. ATS 2003's papers shares state-of-the-art ideas and technologies in testing.