Testing at the Speed of Light
Testing at the Speed of Light

Author: National Academies of Sciences, Engineering, and Medicine

Publisher: National Academies Press

Published: 2018-07-08

Total Pages: 89

ISBN-13: 030947079X

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Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

Space-radiation Damage to Electronic Components and Materials
Space-radiation Damage to Electronic Components and Materials

Author: J. E. Drennan

Publisher:

Published: 1966

Total Pages: 65

ISBN-13:

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Space radiation damage to electronic components and materials is of increasing concern as the nation's space capability develops. This report is a general compilation of information and is intended for use by electronic design engineers during early design phases, in making 'ballpark' predictions of expected electronic equipment performance in the space radiation environment. Transistors appear to be the electronic components that will limit space electronic equipment life because of degradation in gain caused by exposure to space radiation. Careful attention to experimental design principles and effective development and exploitation of theoretical and empirical models relating device performance to radiation energy, flux, and fluence are needed. (Author).

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Author: Ronald D Schrimpf

Publisher: World Scientific

Published: 2004-07-29

Total Pages: 349

ISBN-13: 9814482153

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Radiation Effects in Advanced Semiconductor Materials and Devices
Radiation Effects in Advanced Semiconductor Materials and Devices

Author: C. Claeys

Publisher: Springer Science & Business Media

Published: 2013-11-11

Total Pages: 424

ISBN-13: 3662049740

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This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.

Testing at the Speed of Light
Testing at the Speed of Light

Author: National Academies of Sciences, Engineering, and Medicine (U.S.). Committee on Space Radiation Effects Testing Infrastructure for the U.S. Space Program

Publisher:

Published: 2018

Total Pages: 76

ISBN-13: 9780309470803

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"Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future"--Publisher's description

Ionizing Radiation Effects in Electronics
Ionizing Radiation Effects in Electronics

Author: Marta Bagatin

Publisher: CRC Press

Published: 2018-09-03

Total Pages: 394

ISBN-13: 1498722636

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Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.