Cleaning Technology in Semiconductor Device Manufacturing
Author:
Publisher: The Electrochemical Society
Published: 2000
Total Pages: 636
ISBN-13: 9781566772594
DOWNLOAD EBOOKRead and Download eBook Full
Author:
Publisher: The Electrochemical Society
Published: 2000
Total Pages: 636
ISBN-13: 9781566772594
DOWNLOAD EBOOKAuthor: Karen Reinhardt
Publisher: William Andrew
Published: 2008-12-10
Total Pages: 749
ISBN-13: 0815517734
DOWNLOAD EBOOKThe second Edition of the Handbook of Silicon Wafer Cleaning Technology is intended to provide knowledge of wet, plasma, and other surface conditioning techniques used to manufacture integrated circuits. The integration of the clean processes into the device manufacturing flow will be presented with respect to other manufacturing steps such as thermal, implant, etching, and photolithography processes. The Handbook discusses both wet and plasma-based cleaning technologies that are used for removing contamination, particles, residue, and photoresist from wafer surfaces. Both the process and the equipment are covered. A review of the current cleaning technologies is included. Also, advanced cleaning technologies that are under investigation for next generation processing are covered; including supercritical fluid, laser, and cryoaerosol cleaning techniques. Additionally theoretical aspects of the cleaning technologies and how these processes affect the wafer is discussed such as device damage and surface roughening will be discussed. The analysis of the wafers surface is outlined. A discussion of the new materials and the changes required for the surface conditioning process used for manufacturing is also included. - Focused on silicon wafer cleaning techniques including wet, plasma, and other surface conditioning techniques used to manufacture integrated circuits - As this book covers the major technologies for removing contaminants, it is a reliable reference for anyone that manufactures integrated circuits, or supplies the semiconductor and microelectronics industries - Covers processes and equipment, as well as new materials and changes required for the surface conditioning process - Editors are two of the top names in the field and are both extensively published - Discusses next generation processing techniques including supercritical fluid, laser, and cryoaerosol
Author: Vikram J. Kapoor
Publisher: The Electrochemical Society
Published: 1994
Total Pages: 644
ISBN-13: 9781566770484
DOWNLOAD EBOOKAuthor: Jerzy Rużyłło
Publisher: The Electrochemical Society
Published: 1998
Total Pages: 668
ISBN-13: 9781566771887
DOWNLOAD EBOOKAuthor: Jerzy Rużyłło
Publisher: The Electrochemical Society
Published: 2004
Total Pages: 452
ISBN-13: 9781566774116
DOWNLOAD EBOOKAuthor: Badih El-Kareh
Publisher: Springer Science & Business Media
Published: 1994-12-31
Total Pages: 620
ISBN-13: 9780792395348
DOWNLOAD EBOOKThe drive toward new semiconductor technologies is intricately related to market demands for cheaper, smaller, faster, and more reliable circuits with lower power consumption. The development of new processing tools and technologies is aimed at optimizing one or more of these requirements. This goal can, however, only be achieved by a concerted effort between scientists, engineers, technicians, and operators in research, development, and manufac turing. It is therefore important that experts in specific disciplines, such as device and circuit design, understand the principle, capabil ities, and limitations of tools and processing technologies. It is also important that those working on specific unit processes, such as lithography or hot processes, be familiar with other unit processes used to manufacture the product. Several excellent books have been published on the subject of process technologies. These texts, however, cover subjects in too much detail, or do not cover topics important to modem tech nologies. This book is written with the need for a "bridge" between different disciplines in mind. It is intended to present to engineers and scientists those parts of modem processing technologies that are of greatest importance to the design and manufacture of semi conductor circuits. The material is presented with sufficient detail to understand and analyze interactions between processing and other semiconductor disciplines, such as design of devices and cir cuits, their electrical parameters, reliability, and yield.
Author: Takeshi Hattori
Publisher: Springer Science & Business Media
Published: 2013-03-09
Total Pages: 634
ISBN-13: 3662035359
DOWNLOAD EBOOKA totally new concept for clean surface processing of Si wafers is introduced in this book. Some fifty distinguished researchers and engineers from the leading Japanese semiconductor companies, such as NEC, Hitachi, Toshiba, Sony and Panasonic as well as from several universities reveal to us for the first time the secrets of these highly productive institutions. They describe the techniques and equipment necessary for the preparation of clean high-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.
Author:
Publisher:
Published: 2002
Total Pages: 392
ISBN-13:
DOWNLOAD EBOOKAuthor: N. Dudney
Publisher: The Electrochemical Society
Published: 2011-04
Total Pages: 274
ISBN-13: 1566778972
DOWNLOAD EBOOKThe papers included in this issue of ECS Transactions were originally presented in the symposium ¿Battery / Energy Technology Joint General Session¿, held during the 218th meeting of The Electrochemical Society, in Las Vegas, Nevada from October 10 to 15, 2010.
Author: Ohmi
Publisher: Routledge
Published: 2017-11-01
Total Pages: 948
ISBN-13: 1351406426
DOWNLOAD EBOOKEvaluating the effectiveness of conventional wet processes for cleaning silicon wafers in semiconductor production, this reference reveals concrete measures to improve ultrapure water quality reviewing the structure and physical characteristics of ultrapure water molecules. The volume is divided int