Semiconductor-On-Insulator Materials for Nanoelectronics Applications
Semiconductor-On-Insulator Materials for Nanoelectronics Applications

Author: Alexei Nazarov

Publisher: Springer Science & Business Media

Published: 2011-03-03

Total Pages: 437

ISBN-13: 3642158684

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"Semiconductor-On-Insulator Materials for NanoElectronics Applications” is devoted to the fast evolving field of modern nanoelectronics, and more particularly to the physics and technology of nanoelectronic devices built on semiconductor-on-insulator (SemOI) systems. The book contains the achievements in this field from leading companies and universities in Europe, USA, Brazil and Russia. It is articulated around four main topics: 1. New semiconductor-on-insulator materials; 2. Physics of modern SemOI devices; 3. Advanced characterization of SemOI devices; 4. Sensors and MEMS on SOI. "Semiconductor-On-Insulator Materials for NanoElectonics Applications” is useful not only to specialists in nano- and microelectronics but also to students and to the wider audience of readers who are interested in new directions in modern electronics and optoelectronics.

Introduction to Microelectronics to Nanoelectronics
Introduction to Microelectronics to Nanoelectronics

Author: Manoj Kumar Majumder

Publisher: CRC Press

Published: 2020-11-24

Total Pages: 373

ISBN-13: 1000223078

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Focussing on micro- and nanoelectronics design and technology, this book provides thorough analysis and demonstration, starting from semiconductor devices to VLSI fabrication, designing (analog and digital), on-chip interconnect modeling culminating with emerging non-silicon/ nano devices. It gives detailed description of both theoretical as well as industry standard HSPICE, Verilog, Cadence simulation based real-time modeling approach with focus on fabrication of bulk and nano-devices. Each chapter of this proposed title starts with a brief introduction of the presented topic and ends with a summary indicating the futuristic aspect including practice questions. Aimed at researchers and senior undergraduate/graduate students in electrical and electronics engineering, microelectronics, nanoelectronics and nanotechnology, this book: Provides broad and comprehensive coverage from Microelectronics to Nanoelectronics including design in analog and digital electronics. Includes HDL, and VLSI design going into the nanoelectronics arena. Discusses devices, circuit analysis, design methodology, and real-time simulation based on industry standard HSPICE tool. Explores emerging devices such as FinFETs, Tunnel FETs (TFETs) and CNTFETs including their circuit co-designing. Covers real time illustration using industry standard Verilog, Cadence and Synopsys simulations.

Point Defects in Semiconductors and Insulators
Point Defects in Semiconductors and Insulators

Author: Johann-Martin Spaeth

Publisher: Springer Science & Business Media

Published: 2003-01-22

Total Pages: 508

ISBN-13: 9783540426950

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The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about 10 years ago. Since then a very active development has oc curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for "fundamental" studies in solid state physics. Therefore a more "pedestrian" access to the meth ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the structural information one can get from "forbidden" transitions as well as on spatial correlations between defects in the so-called "cross relaxation spectroscopy". High-field ODEPR/ENDOR was also added. The chapter on stationary electron nuclear double resonance (ENDOR) was supplemented by the method of stochastic END OR developed a few years ago in Paderborn which is now also commercially available.

1998 IEEE Semiconducting and Insulating Materials Conference
1998 IEEE Semiconducting and Insulating Materials Conference

Author: Zuzanna Liliental-Weber

Publisher: Institute of Electrical & Electronics Engineers(IEEE)

Published: 1999

Total Pages: 364

ISBN-13:

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Contributors to this proceedings volume discuss: growth, characterization, theory, device applications and material issues of the III-V semiconductors which can be rendered insulating by special procedures or treatments, and of other promising compound materials such as SiGe, SiC and GaNA1N.