Selected Reprints on Logic Design for Testability
Author: Constantin C. Timoc
Publisher:
Published: 1984
Total Pages: 332
ISBN-13:
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Designer's Guide to Testable Asic Devices
Author: Wayne M. Needham
Publisher: Springer Science & Business Media
Published: 1991-01-10
Total Pages: 336
ISBN-13: 9780442002213
DOWNLOAD EBOOKWhile making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation copyrighted by Book News, Inc., Portland, OR
Principles of Testing Electronic Systems
Author: Samiha Mourad
Publisher: John Wiley & Sons
Published: 2000-07-25
Total Pages: 444
ISBN-13: 9780471319313
DOWNLOAD EBOOKA pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Author: M. Bushnell
Publisher: Springer Science & Business Media
Published: 2006-04-11
Total Pages: 690
ISBN-13: 0306470403
DOWNLOAD EBOOKThe modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Logic Testing and Design for Testability
Author: Hideo Fujiwara
Publisher: MIT Press
Published: 1985
Total Pages: 314
ISBN-13:
DOWNLOAD EBOOKDesign for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.
LSI/VLSI Testability Design
Author: Frank F. Tsui
Publisher: McGraw-Hill Companies
Published: 1987
Total Pages: 730
ISBN-13:
DOWNLOAD EBOOKTutorial, Modern Design and Analysis of Discrete-event Computer Simulations
Author: Edward J. Dudewicz
Publisher:
Published: 1985
Total Pages: 502
ISBN-13:
DOWNLOAD EBOOK"The objective of this tutorial is to provide a working understanding of the design, implementation, and analysis of computer simulations."--Preface
Tutorial
Author: William Stallings
Publisher:
Published: 1986
Total Pages: 388
ISBN-13:
DOWNLOAD EBOOKOne of the most important innovations in computer development is the reduced instruction set computer (RISC). An analysis of the RISC architecture brings into focus many important issues in computer organization and architecture. The objectives of this tutorial are to (1) provide a comprehensive introduction to RISC and (2) give readers an understanding of RISC design issues, and the ability to asses their importance relative to other approaches. This tutorial is intended for students, professionals in the fields of computer science and computer engineering, designers and implementers, and data processing managers who now find RISC machines among their available processor choices.
