Selected Papers from NC-AFM 2004
Author: Udo Schwarz
Publisher:
Published: 2005
Total Pages: 137
ISBN-13:
DOWNLOAD EBOOKRead and Download eBook Full
Author: Udo Schwarz
Publisher:
Published: 2005
Total Pages: 137
ISBN-13:
DOWNLOAD EBOOKAuthor: International Conference on Non-Contact Atomic Force Microscopy. 7, 2004, Seattle, Wash..
Publisher:
Published: 2005
Total Pages: 138
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 2005
Total Pages: 137
ISBN-13:
DOWNLOAD EBOOKAuthor: International Conference on Non-Contact Atomic Force Microscopy
Publisher:
Published: 2005
Total Pages: 138
ISBN-13:
DOWNLOAD EBOOKAuthor:
Publisher:
Published: 2005
Total Pages: 137
ISBN-13:
DOWNLOAD EBOOKAuthor: David J. Whitehouse
Publisher: CRC Press
Published: 2010-12-20
Total Pages: 982
ISBN-13: 1420082027
DOWNLOAD EBOOKSince the publication of the first edition, miniaturization and nanotechnology have become inextricably linked to traditional surface geometry and metrology. This interdependence of scales has had profound practical implications.Updated and expanded to reflect many new developments, Handbook of Surface and Nanometrology, Second Edition determines h
Author: John C. Russ
Publisher: CRC Press
Published: 2018-09-03
Total Pages: 1035
ISBN-13: 1498740286
DOWNLOAD EBOOKConsistently rated as the best overall introduction to computer-based image processing, The Image Processing Handbook covers two-dimensional (2D) and three-dimensional (3D) imaging techniques, image printing and storage methods, image processing algorithms, image and feature measurement, quantitative image measurement analysis, and more. Incorporating image processing and analysis examples at all scales, from nano- to astro-, this Seventh Edition: Features a greater range of computationally intensive algorithms than previous versions Provides better organization, more quantitative results, and new material on recent developments Includes completely rewritten chapters on 3D imaging and a thoroughly revamped chapter on statistical analysis Contains more than 1700 references to theory, methods, and applications in a wide variety of disciplines Presents 500+ entirely new figures and images, with more than two-thirds appearing in color The Image Processing Handbook, Seventh Edition delivers an accessible and up-to-date treatment of image processing, offering broad coverage and comparison of algorithms, approaches, and outcomes.
Author: Robert Leoni
Publisher: World Scientific
Published: 2005-04-26
Total Pages: 314
ISBN-13: 9814480800
DOWNLOAD EBOOKThis volume presents state-of-the-art works from top academic and research institutions in the areas of high performance semiconductor materials, devices, and circuits. A broad coverage of topics relating to high performance devices and circuits is featured here. There are 46 contributed papers covering a wide range of materials, device types, and applications. These papers describe the results of ongoing research in three general areas: high speed technologies for advanced mixed signal and terahertz applications, advanced technologies for high performance optical links and light sources, and high power density and high efficiency technologies for next generation microwave front ends and power electronics.
Author: Seizo Morita
Publisher: Springer Science & Business Media
Published: 2009-09-18
Total Pages: 410
ISBN-13: 364201495X
DOWNLOAD EBOOKSince the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.