Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy

Author: Yasuo Cho

Publisher: Woodhead Publishing

Published: 2020-05-20

Total Pages: 258

ISBN-13: 0081028032

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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. - Presents an in-depth look at the SNDM materials characterization technique by its inventor - Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices - Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique


Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy

Author: Yasuo Cho

Publisher: Woodhead Publishing

Published: 2020-05-21

Total Pages: 256

ISBN-13: 0128172460

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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.


Nanoscale Characterisation of Ferroelectric Materials

Nanoscale Characterisation of Ferroelectric Materials

Author: Marin Alexe

Publisher: Springer Science & Business Media

Published: 2013-03-09

Total Pages: 290

ISBN-13: 3662089017

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This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.


Roadmap of Scanning Probe Microscopy

Roadmap of Scanning Probe Microscopy

Author: Seizo Morita

Publisher: Springer Science & Business Media

Published: 2006-12-30

Total Pages: 207

ISBN-13: 3540343156

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Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.


Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Author: Paula M. Vilarinho

Publisher: Springer Science & Business Media

Published: 2006-06-15

Total Pages: 503

ISBN-13: 1402030193

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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.


Applied Scanning Probe Methods X

Applied Scanning Probe Methods X

Author: Bharat Bhushan

Publisher: Springer Science & Business Media

Published: 2007-12-20

Total Pages: 475

ISBN-13: 3540740856

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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.


Polar Oxides

Polar Oxides

Author: Rainer Waser

Publisher: John Wiley & Sons

Published: 2006-03-06

Total Pages: 391

ISBN-13: 3527604898

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Here, more than 20 experts from leading research institutes around the world present the entire scope of this rapidly developing field. In so doing, they cover a wide range of topics, including the characterization and investigation of structural, dielectric and piezoelectric properties of ceramic materials, a well as phase transitions, electrical and optical properties and microscopic investigations. Another feature is a complete profile of the properties of polar oxides -- from their proof to their latest applications. Throughout, the authors review, discuss and assess the material properties with regard to new and advanced characterization and imaging techniques. For physicists, physicochemists, semiconductor and solid state physicists, materials scientists, and students of chemistry and physics.


Innovative Graphene Technologies

Innovative Graphene Technologies

Author: Atul Tiwari

Publisher: Smithers Rapra

Published: 2013-09-02

Total Pages: 564

ISBN-13: 1909030236

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Graphene has already gained a unique reputation among novel synthetic materials. Dedicated efforts and enormous resources are being invested in creating viable commercial products. The high electrical and thermal conductivities in graphene are well known, and most of the applications of this material are pivoted to these properties. In addition to electronic and thermal management applications there are several other vital areas where graphene can be used successfully. This book is compiled in two volumes. Volume 1 is specifically meant for beginners who want to know the science and technology associated with this nanomaterial. This volume consists of chapters that are specifically written for readers who are looking for the applications of graphene and its derivatives. The first objective of this book is to provide readers with numerical/physics based models for assessment of graphene for targeted applications. The second objective of this book is to introduce readers to the industrial applications of graphene. Chapters are carefully written so that readers can choose methodologies for screening of graphene materials for a particular application. This second volume is written for broader readership including young scholars and researchers with diverse backgrounds such as chemistry, physics, materials science, and engineering. It can be used as a textbook for graduate students, and also as a review or reference book for researchers from different branches of materials science.


Ferroelectric Random Access Memories

Ferroelectric Random Access Memories

Author: Hiroshi Ishiwara

Publisher: Springer Science & Business Media

Published: 2004-04-16

Total Pages: 316

ISBN-13: 9783540407188

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The book consists of 5 parts: (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects; each part is further divided into several chapters. Because of the wide range of topics discussed, each chapter in this book was written by one of the best authors knowing the specific topic very well.


Measurement Techniques for Radio Frequency Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics

Author: T. Mitch Wallis

Publisher: Cambridge University Press

Published: 2017-09-14

Total Pages: 329

ISBN-13: 1107120683

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Featuring numerous examples linking theoretical concepts with real-world applications, this practical, cross-disciplinary guide will help you understand the fundamentals of radio frequency measurement of nanoscale devices. -- Résumé abrégé du livre.