Author: Andrew Holmes-Siedle

Publisher: Oxford University Press, USA

Published: 1993

Total Pages: 512

ISBN-13:

Of requirements for steady-state radiation sources -- Cosmic ray upset simulation -- Heavy ions -- Fission fragments -- Laser light -- Dosimetry for radiation testing -- Test procedures for semiconductor devices -- Comparison of space with military requirements -- Radiation response specifications -- Product assurance techniques and special radiation assessment -- ESA/SCC and ECSS specifications (Europe) -- BS 9000 specifications and CECC (Europe) -- MIL specifications (USA) -- ASTM specifications (USA) -- Electronic Industries Association EIA (USA) -- Comparison of standards -- Engineering materials -- Time-dependent effects and post-irradiation effects -- Radiation-hardening of semiconductor parts -- Methodology of total-dose hardening -- Hardening of a process -- Material preparation and cleaning -- Oxide growth -- Oxide anneal -- Gate electrode -- Modified gate insulators -- Field oxide hardening -- Other processing steps -- Hardening for total dose by 'layout' -- Hardening against transient radiation -- Pulsed gamma rays -- Single-event upsets -- Commercial radiation-hard and radiation-tolerant technologies -- Deep submicron technology -- Silicon on insulator (SOI) -- Standard products -- 'Fabless' manufacturer -- Hardening of parts other than silicon -- Equipment hardening and hardness assurance -- Elementary rules of hardening -- Hardening measures at the systems level -- Robots, diagnostics and military vehicles in penetrating radiation -- Manipulators for nuclear plant -- Hardening of a robotic vehicle.