Quantitative X-Ray Diffractometry
Quantitative X-Ray Diffractometry

Author: Lev S. Zevin

Publisher: Springer Science & Business Media

Published: 2012-12-06

Total Pages: 389

ISBN-13: 1461395356

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One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.

Introduction to X-Ray Powder Diffractometry
Introduction to X-Ray Powder Diffractometry

Author: Ron Jenkins

Publisher: Wiley-Interscience

Published: 1996-07-12

Total Pages: 440

ISBN-13:

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Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material.

Modern Powder Diffraction
Modern Powder Diffraction

Author: David L. Bish

Publisher: Walter de Gruyter GmbH & Co KG

Published: 2018-12-17

Total Pages: 384

ISBN-13: 1501509012

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Volume 20 of Reviews in Mineralogy attempted to: (1) provide examples illustrating the state-of-the-art in powder diffraction, with emphasis on applications to geological materials; (2) describe how to obtain high-quality powder diffraction data; and (3) show how to extract maximum information from available data. In particular, the nonambient experiments are examples of some of the new and exciting areas of study using powder diffraction, and the interested reader is directed to the rapidly growing number of published papers on these subjects. Powder diffraction has evolved to a point where considerable information can be obtained from ug-sized samples, where detection limits are in the hundreds of ppm range, and where useful data can be obtained in milliseconds to microseconds. We hope that the information in this volume will increase the reader's access to the considerable amount of information contained in typical diffraction data.

Quantitative X-Ray Spectrometry, Second Edition,
Quantitative X-Ray Spectrometry, Second Edition,

Author: Ron Jenkins

Publisher: CRC Press

Published: 1995-04-26

Total Pages: 512

ISBN-13: 9780824795542

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This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.

X-Ray Diffraction Crystallography
X-Ray Diffraction Crystallography

Author: Yoshio Waseda

Publisher: Springer Science & Business Media

Published: 2011-03-18

Total Pages: 320

ISBN-13: 3642166350

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X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

High-Resolution Transmission Electron Microscopy
High-Resolution Transmission Electron Microscopy

Author: Peter Buseck

Publisher: Oxford University Press

Published: 1989-02-02

Total Pages: 668

ISBN-13: 0195364651

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This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.

Quantitative Mineral Analysis of Clays
Quantitative Mineral Analysis of Clays

Author: C. S. Calvert

Publisher:

Published: 1989

Total Pages: 188

ISBN-13:

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Principles and techniques of quantitative analysis of clay minerals by X-ray Powder Diffraction; A computer program for semiquantitative mineral analysis by x-ray powder diffraction; A computer technique for x-ray diffraction curve fitting/peak decomposition; Quantitative mineral analysis by x-ray transmission and x-ray diffraction; Quantitatice determination of clays and other minerals in rocks; A combined x-ray Powder diffraction ans chemical method for the quantitative mineral analysis of geologic samples.